Search Results - "Naka, Masato" :: K.UTB vyhledávací portál

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COORDINATE DETECTION METHOD, COORDINATE OUTPUT APPARATUS, DEFECT INSPECTION APPARATUS

by NAKA MASATO
Year of Publication 11.10.2018

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Patent

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INSPECTION APPARATUS AND INSPECTION METHOD

by NAKA MASATO
Year of Publication 09.03.2017

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Patent

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INSPECTION DEVICE AND INSPECTION METHOD

by CHIBA KEISUKE, NAKA MASATO, YOSHIKAWA RYOJI
Year of Publication 28.07.2022

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Patent

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LIGHT-REFLECTIVE LITHOGRAPHY MASK, INSPECTION METHOD THEREFOR, INSPECTION APPARATUS, AND MASK BLANK

by NAKA MASATO, TAKAI KOSUKE
Year of Publication 23.09.2016

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Patent

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On characterizing and computing the diversity of hyperlinks for anti-spamming page ranking

by Yang, Bo, Chen, Hechang, Zhao, Xuehua, Naka, Masato, Huang, Jing
Published in Knowledge-based systems (01.03.2015)

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Journal Article

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INSPECTION DEVICE

by YAMAGUCHI SHINJI, HAYASHI TAKEHIDE, HATAKEYAMA MASAKI, NAKA MASATO
Year of Publication 12.11.2015

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Patent

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INSPECTION APPARATUS

by YAMAGUCHI SHINJI, HATAKEYAMA MASAHIRO, HAYASHI TAKEHIDE, NAKA MASATO
Year of Publication 14.10.2015

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Patent

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PRODUCTION METHOD FOR SUBSTRATE, SUBSTRATE PROCESSING APPARATUS AND PRODUCTION SYSTEM FOR SUBSTRATE

by TAKEMOTO TETSUO, INUKAI MINAKO, OTSUBO KYO, MASUI KENJI, SAKURAI HIDEAKI, NAKA MASATO
Year of Publication 28.09.2017

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Patent

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Method for detecting coordinates, coordinate output device and defect inspection device

by Naka, Masato
Year of Publication 10.03.2020

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Patent

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ORIGINAL PLATE MANUFACTURING METHOD, DRAWING DATA CREATION METHOD, AND PATTERN DEFECT REPAIRING METHOD

by NAKA, Masato, YOSHIKAWA, Ryoji
Year of Publication 03.02.2022

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Patent

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Inspection device, inspection method, and image processing program

by Naka, Masato
Year of Publication 09.10.2018

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Patent

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METHOD FOR DETECTING COORDINATES, COORDINATE OUTPUT DEVICE AND DEFECT INSPECTION DEVICE

by NAKA, Masato
Year of Publication 27.09.2018

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Patent

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Inspection method and inspection apparatus

by Yoshikawa, Ryoji, Naka, Masato, Chiba, Keisuke
Year of Publication 07.05.2024

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Patent

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INSPECTION DEVICE, INSPECTION METHOD, AND IMAGE PROCESSING PROGRAM

by Naka Masato
Year of Publication 09.03.2017

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Patent

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INSPECTION METHOD AND INSPECTION APPARATUS

by NAKA, Masato, YOSHIKAWA, Ryoji, CHIBA, Keisuke
Year of Publication 21.07.2022

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Patent

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Reflective Photomask, Method for Inspecting Same and Mask Blank

by NAKA Masato, TAKAI Kosuke
Year of Publication 15.09.2016

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Patent

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Inspection apparatus

by Yamaguchi Shinji, Naka Masato, Hayashi Takehide, Hatakeyama Masahiro
Year of Publication 08.08.2017

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Patent

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INSPECTION APPARATUS

by NAKA Masato, HAYASHI Takehide, YAMAGUCHI Shinji, HATAKEYAMA Masahiro
Year of Publication 03.11.2016

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Patent

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Inspection apparatus

by YAMAGUCHI SHINJI, HATAKEYAMA MASAHIRO, HAYASHI TAKEHIDE, NAKA MASATO
Year of Publication 14.06.2016

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Patent

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INSPECTION APPARATUS

by YAMAGUCHI SHINJI, HATAKEYAMA MASAHIRO, HAYASHI TAKEHIDE, NAKA MASATO
Year of Publication 08.10.2015

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Patent

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