5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology
Kim, HyunChul, Park, Jongeun, Joe, Insung, Kwon, Doowon, Kim, Joo Hyoung, Cho, Dongsuk, Lee, Taehun, Lee, Changkyu, Park, Haeyong, Hong, Soojin, Chang, Chongkwang, Kim, Jingyun, Lim, Hanjin, Oh, Youngsun, Kim, Yitae, Nah, Seungjoo, Jung, Sangill, Lee, Jaekyu, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
IMAGE SENSORS AND METHODS OF MANUFACTURING THE SAME
HAN, Dongmin, JEONG, Heegeun, JEONG, Hoemin, NAH, Seungjoo, CHOI, Soongeul
Year of Publication 28.12.2023
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Year of Publication 28.12.2023
Patent
Optical design of dispersive metasurface nano-prism structure for high sensitivity CMOS image sensor
Choi, Chulsoo, Park, Jonghoon, Lee, Yunki, Kim, Bumsuk, Kim, Junghoon, Kim, Sunwook, Kim, Junghyun, Roh, Sookyoung, Ahn, Sungmo, Mun, Sangeun, Lee, Beomsuk, Nah, Seungjoo, Park, Howoo, Kim, Hyunchul, Moon, Changrok, Yun, Seokho, Ahn, Jungchak, Yim, Joonseo
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding