Tunable diode-laser absorption measurements of methane at elevated temperatures
Nagali, V, Chou, S I, Baer, D S, Hanson, R K, Segall, J
Published in Applied optics (2004) (20.07.1996)
Published in Applied optics (2004) (20.07.1996)
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Journal Article
Procurement Risk Management (PRM) at Hewlett-Packard Company
Nagali, Venu, Hwang, Jerry, Sanghera, David, Gaskins, Matt, Pridgen, Mark, Thurston, Tim, Mackenroth, Patty, Branvold, Dwight, Scholler, Patrick, Shoemaker, Greg
Published in Interfaces (Providence) (01.01.2008)
Published in Interfaces (Providence) (01.01.2008)
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Journal Article
Shock-tube study of high-pressure H2O spectroscopy
Nagali, V, Herbon, J T, Horning, D C, Davidson, D F, Hanson, R K
Published in Applied optics (2004) (20.11.1999)
Published in Applied optics (2004) (20.11.1999)
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Journal Article