A CAFM and device level study of MIS structures with graphene as interfacial layer for ReRAM applications
Claramunt, S., Ruiz, A., Wu, Q., Porti, M., Nafría, M., Aymerich, X.
Published in Solid-state electronics (01.12.2021)
Published in Solid-state electronics (01.12.2021)
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Journal Article
Grain boundary mediated leakage current in polycrystalline HfO2 films
MCKENNA, K, SHLUGER, A, IGLESIAS, V, PORTI, M, NAFRIA, M, LANZA, M, BERSUKER, G
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
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Conference Proceeding
Journal Article
Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation
Saraza-Canflanca, P., Martin-Martinez, J., Castro-Lopez, R., Roca, E., Rodriguez, R., Fernandez, F. V., Nafria, M.
Published in IEEE transactions on electron devices (01.08.2021)
Published in IEEE transactions on electron devices (01.08.2021)
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Journal Article
Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol
Salvador, E., Rodriguez, R., Miranda, E., Martin-Martinez, J., Rubio, A., Ntinas, V., Sirakoulis, G. Ch, Crespo-Yepes, A., Nafria, M.
Published in IEEE transactions on electron devices (01.09.2024)
Published in IEEE transactions on electron devices (01.09.2024)
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Journal Article
Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs
Saraza-Canflanca, P., Castro-Lopez, R., Roca, E., Martin-Martinez, J., Rodriguez, R., Nafria, M., Fernandez, F. V.
Published in IEEE transactions on electron devices (01.10.2022)
Published in IEEE transactions on electron devices (01.10.2022)
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Journal Article
Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements
Couso, C., Iglesias, V., Porti, M., Claramunt, S., Nafria, M., Domingo, N., Cordes, A., Bersuker, G.
Published in IEEE electron device letters (01.05.2016)
Published in IEEE electron device letters (01.05.2016)
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Journal Article
Tuning the conductivity of resistive switching devices for electronic synapses
Pedro, M., Martin-Martinez, J., Gonzalez, M.B., Rodriguez, R., Campabadal, F., Nafria, M., Aymerich, Xavier
Published in Microelectronic engineering (25.06.2017)
Published in Microelectronic engineering (25.06.2017)
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Journal Article
Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
Lanza, M., Bayerl, A., Gao, T., Porti, M., Nafria, M., Jing, G. Y., Zhang, Y. F., Liu, Z. F., Duan, H. L.
Published in Advanced materials (Weinheim) (13.03.2013)
Published in Advanced materials (Weinheim) (13.03.2013)
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Journal Article
Non-homogeneous conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM
Claramunt, S., Wu, Q., Maestro, M., Porti, M., Gonzalez, M.B., Martin-Martinez, J., Campabadal, F., Nafría, M.
Published in Microelectronic engineering (01.11.2015)
Published in Microelectronic engineering (01.11.2015)
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Journal Article
An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devices
Pedro, M., Martin-Martinez, J., Rodriguez, R., Gonzalez, M.B., Campabadal, F., Nafria, M.
Published in Microelectronic engineering (15.07.2019)
Published in Microelectronic engineering (15.07.2019)
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Journal Article
CAFM Experimental Considerations and Measurement Methodology for In-Line Monitoring and Quantitative Analysis of III–V Materials Defects
Porti, M., Iglesias, V., Wu, Q., Couso, C., Claramunt, S., Nafria, M., Cordes, A., Bersuker, G.
Published in IEEE transactions on nanotechnology (01.11.2016)
Published in IEEE transactions on nanotechnology (01.11.2016)
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Journal Article
Combined nanoscale KPFM characterization and device simulation for the evaluation of the MOSFET variability related to metal gate workfunction fluctuations
Ruiz, A., Seoane, N., Claramunt, S., García-Loureiro, A., Porti, M., Nafria, M.
Published in Microelectronic engineering (15.08.2019)
Published in Microelectronic engineering (15.08.2019)
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Journal Article
Efficient methodology to extract interface traps parameters for TCAD simulations
Couso, C., Martin-Martinez, J., Porti, M., Nafria, M., Aymerich, X.
Published in Microelectronic engineering (25.06.2017)
Published in Microelectronic engineering (25.06.2017)
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Journal Article
The histo structure of galls induced by aphids as a useful taxonomic character: the case of Rectinasus (Hemiptera, Aphididae, Eriosomatinae)
Álvarez, Rafael, Molist, Pilar, González-Sierra, Silvia, Martinez, Jean Jacques Itzhak, Nafría, Juan M Nieto
Published in Zootaxa (17.09.2014)
Published in Zootaxa (17.09.2014)
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Journal Article
MOSFET degradation dependence on input signal power in a RF power amplifier
Crespo-Yepes, A., Barajas, E., Martin-Martinez, J., Mateo, D., Aragones, X., Rodriguez, R., Nafria, M.
Published in Microelectronic engineering (25.06.2017)
Published in Microelectronic engineering (25.06.2017)
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