Epitaxial growth and diffusion characteristics analysis of vertical thin poly-Si channel transfer gate structured pixels for 3D CMOS image sensor
Sung-Kun Park, Donghyun Woo, Min-Ki Na, Pyong-Su Kwag, Ho-Ryeong Lee, Kyoung-Wook Ro, Kyung-Hwan Kim, Dong-Kyu Lee, Hong, Chris, In-Wook Cho, Kyung-Dong Yoo
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
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Conference Proceeding
Carrier transport mechanism in La-incorporated high- k dielectric/metal gate stack MOSFETs
Kwon, Hyuk-Min, Choi, Won-Ho, Han, In-Shik, Na, Min-Ki, Park, Sang-Uk, Bok, Jung-Deuk, Kang, Chang-Yong, Lee, Byoung-Hun, Jammy, Raj, Lee, Hi-Deok
Published in Microelectronic engineering (01.12.2011)
Published in Microelectronic engineering (01.12.2011)
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Journal Article
Effect of Si interlayer thickness and post-metallization annealing on Ge MOS capacitor on Ge-on-Si substrate
Yoo, Ook Sang, Oh, Jungwoo, Kang, Chang Yong, Lee, Byoung Hun, Han, In Shik, Choi, Won-Ho, Kwon, Hyuk-Min, Na, Min-Ki, Majhi, Prashant, Tseng, Hsing-Huang, Jammy, Raj, Wang, Jin Suk, Lee, Hi-Deok
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
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Journal Article
Investigation of Device Performance and Negative Bias Temperature Instability of Plasma Nitrided Oxide in Nanoscale p-Channel Metal–Oxide–Semiconductor Field-Effect Transistor's
Han, In-Shik, Ji, Hee-Hwan, Goo, Tae-Gyu, Yoo, Ook-Sang, Choi, Won-Ho, Kim, Yong-Goo, Park, Sung-Hyung, Lee, Heui-Seung, Kang, Young-Seok, Kim, Dae-Byung, Lee, Hi-Deok
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article
New Charge Pumping Method for Characterization of Charge Trapping Layer in Oxide–Nitride–Oxide Structure
Choi, Won-Ho, Park, Sung-Soo, Han, In-Shik, Om, Jae-Chul, Lee, Seaung-Suk, Bae, Gi-Hyun, Lee, Hi-Deok, Lee, Ga-Won
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article
Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor
Choi, Won-Ho, Oh, Jungwoo, Yoo, Ook-Sang, Han, In-Shik, Na, Min-Ki, Kwon, Hyuk-Min, Park, Byung-Suk, Majhi, P., Tseng, H.-H., Jammy, R., Lee, Hi-Deok
Published in Microelectronic engineering (01.12.2011)
Published in Microelectronic engineering (01.12.2011)
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Journal Article
Conference Proceeding
Comparison of La-based high- k dielectrics: HfLaSiON and HfLaON
Choi, Won-Ho, Han, In-Shik, Kwon, Hyuk-Min, Goo, Tae-Gyu, Na, Min-Ki, Yoo, Ook-Sang, Lee, Ga-Won, Kang, Chang Yong, Choi, Rino, Song, Seung Chul, Lee, Byoung Hun, Jammy, Raj, Jeong, Yoon-Ha, Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
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Journal Article
Conference Proceeding
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs
Yoo, Ook Sang, Oh, Jungwoo, Min, Kyung Seok, Kang, Chang Yong, Lee, B.H., Lee, Kyong Taek, Na, Min Ki, Kwon, Hyuk-Min, Majhi, P., Tseng, H-H, Jammy, Raj, Wang, J.S., Lee, Hi-Deok
Published in Microelectronic engineering (01.03.2009)
Published in Microelectronic engineering (01.03.2009)
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Journal Article
Conference Proceeding
Time-Dependent Dielectric Breakdown of [Formula Omitted]-Doped High-[Formula Omitted]/Metal Gate Stacked NMOSFETs
Han, In-Shik, Choi, Won-Ho, Kwon, Hyuk-Min, Na, Min-Ki, Zhang, Ying-Ying, Kim, Yong-Goo, Wang, Jin-Suk, Kang, Chang Yong, Bersuker, G, Lee, Byoung Hun, Jeong, Yoon Ha, Lee, Hi-Deok, Jammy, R
Published in IEEE electron device letters (01.03.2009)
Published in IEEE electron device letters (01.03.2009)
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Journal Article
Time-Dependent Dielectric Breakdown of \hbox \hbox-Doped High- k/Metal Gate Stacked NMOSFETs
In-Shik Han, Won-Ho Choi, Hyuk-Min Kwon, Min-Ki Na, Ying-Ying Zhang, Yong-Goo Kim, Jin-Suk Wang, Chang Yong Kang, Bersuker, G., Byoung Hun Lee, Yoon Ha Jeong, Hi-Deok Lee, Jammy, R.
Published in IEEE electron device letters (01.03.2009)
Published in IEEE electron device letters (01.03.2009)
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Journal Article
Time-Dependent Dielectric Breakdown of hbox La 2 hbox O 3 -Doped High- k /Metal Gate Stacked NMOSFETs
Han, In-Shik, Choi, Won-Ho, Kwon, Hyuk-Min, Na, Min-Ki, Zhang, Ying-Ying, Kim, Yong-Goo, Wang, Jin-Suk, Kang, Chang Yong, Bersuker, G, Lee, Byoung Hun, Jeong, Yoon Ha, Lee, Hi-Deok, Jammy, R
Published in IEEE electron device letters (01.01.2009)
Published in IEEE electron device letters (01.01.2009)
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Journal Article
Time-Dependent Dielectric Breakdown of La2O3-Doped High-k/Metal Gate Stacked NMOSFETs
HAN, In-Shik, CHOI, Won-Ho, YOON HA JEONG, LEE, Hi-Deok, JAMMY, Raj, KWON, Hyuk-Min, NA, Min-Ki, ZHANG, Ying-Ying, KIM, Yong-Goo, WANG, Jin-Suk, CHANG YONG KANG, BERSUKER, Gennadi, BYOUNG HUN LEE
Published in IEEE electron device letters (01.03.2009)
Published in IEEE electron device letters (01.03.2009)
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Journal Article
Image sensor and method for fabricating the same
Lee, Cha-Young, Kwon, Young-Jun, Woo, Dong-Hyun, Lee, Ho-Ryeong, Park, Sung-Kun, Na, Min-Ki, Yang, Yun-Hui, Kwag, Pyong-Su
Year of Publication 26.06.2018
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Year of Publication 26.06.2018
Patent
Image sensor including vertical transfer gate
Park Sung-Kun, Woo Donghyun, Lee Ho-Ryeong, Kwag Pyong-Su, Lee Cha-Young, Kwon Young-Jun, Na Min-Ki, Yang Yun-Hui
Year of Publication 27.03.2018
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Year of Publication 27.03.2018
Patent
Image sensor including vertical transfer gate
Park Sung-Kun, Woo Donghyun, Lee Ho-Ryeong, Kwag Pyong-Su, Lee Cha-Young, Kwon Young-Jun, Na Min-Ki, Yang Yun-Hui
Year of Publication 11.04.2017
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Year of Publication 11.04.2017
Patent
A comprehensive and comparative study of interface and bulk characteristics of nMOSETs with la-incorporated high-k dielectrics
Won-Ho Choi, Hyuk-Min Kwon, In-Shik Han, Tae-Gyu Goo, Min-Ki Na, Chang Yong Kang, Gennadi Bersuker, Byoung Hun Lee, Yoon-Ha Jeong, Hi-Deok Lee, Jammy, R.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding