Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Labat, Nathalie, Marc, François, Frémont, Hélène, Nolhier, Nicolas
Published in Microelectronics Reliability (01.11.2021)
Published in Microelectronics Reliability (01.11.2021)
Get full text
Journal Article
Publication
Editorial
Bafleur, Marise, Perdu, Philippe, Marc, François, Fremont, Hélène, Nolhier, Nicolas
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
Get full text
Journal Article
Implementation of Thermoelectric Generators in Airliners for Powering Battery-Free Wireless Sensor Networks
Dilhac, Jean-Marie, Monthéard, Romain, Bafleur, Marise, Boitier, Vincent, Durand-Estèbe, Paul, Tounsi, Patrick
Published in Journal of electronic materials (01.06.2014)
Published in Journal of electronic materials (01.06.2014)
Get full text
Journal Article
Conference Proceeding
Prediction of LIN communication robustness against EFT events using dedicated failure models
Escudié, F., Caignet, F., Nolhier, N., Bafleur, M.
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
Get full text
Journal Article
Impact of non-linear capacitances on transient waveforms during system level ESD stress
Escudié, F., Caignet, F., Nolhier, N., Bafleur, M.
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
Get full text
Journal Article
Reliability assessment of electrostatically driven MEMS devices: based on a pulse-induced charging technique
Ruan, Jinyu J, Trémouilles, David, Coccetti, Fabio, Nolhier, Nicolas, Papaioannou, George, Plana, Robert
Published in Journal of micromechanics and microengineering (01.04.2012)
Published in Journal of micromechanics and microengineering (01.04.2012)
Get full text
Journal Article
Reliability of ESD protection devices designed in a 3D technology
Courivaud, B., Nolhier, N., Ferru, G., Bafleur, M., Caignet, F.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
Get full text
Journal Article
Conference Proceeding
Coupling Supercapacitors and Aeroacoustic Energy Harvesting for Autonomous Wireless Sensing in Aeronautics Applications
Monthéard, Romain, Bafleur, Marise, Boitier, Vincent, Dollat, Xavier, Nolhier, Nicolas, Piot, Estelle, Airiau, Christophe, Dilhac, Jean-Marie
Published in Energy harvesting and systems (01.10.2016)
Published in Energy harvesting and systems (01.10.2016)
Get full text
Journal Article
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices
Ruan, Jinyu J., Monnereau, Nicolas, Trémouilles, David, Mauran, Nicolas, Coccetti, Fabio, Nolhier, Nicolas, Plana, Robert
Published in IEEE transactions on instrumentation and measurement (01.02.2012)
Published in IEEE transactions on instrumentation and measurement (01.02.2012)
Get full text
Journal Article
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress
Caigneť, F., Nolhier, N., Bafleur, M., Wang, A., Mauran, N.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
Get full text
Journal Article
Conference Proceeding