Search Results - "NIMURA KAZUTAKA" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

A cryo-TSEM with temperature cycling capability allows deep sublimation of ice to uncover fine structures in thick cells

A cryo-TSEM with temperature cycling capability allows deep sublimation of ice to uncover fine structures in thick cells

by Usukura, Jiro, Narita, Akihiro, Matsumoto, Tomoharu, Usukura, Eiji, Sunaoshi, Takeshi, Watanabe, Syunya, Tamba, Yusuke, Nagakubo, Yasuhira, Mizuo, Takashi, Azuma, Junzo, Osumi, Masako, Nimura, Kazutaka, Tamochi, Ryuichiro, Ose, Yoichi
Published in Scientific reports (01.11.2021)

Get full text

Journal Article

CHARGED PARTICLE BEAM DEVICE, ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

CHARGED PARTICLE BEAM DEVICE, ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

by NAGAKUBO YASUHIRA, NIMURA KAZUTAKA, SUNAOSHI TAKESHI
Year of Publication 14.04.2016

Get full text

Patent

ANTI-CONTAMINATION TRAP, AND VACUUM APPLICATION DEVICE

ANTI-CONTAMINATION TRAP, AND VACUUM APPLICATION DEVICE

by MIZUO TAKASHI, TAMBA YUSUKE, NIMURA KAZUTAKA, HATANO HARUHIKO
Year of Publication 26.03.2015

Get full text

Patent

Charged particle beam device, electron microscope and sample observation method

Charged particle beam device, electron microscope and sample observation method

by Nimura, Kazutaka, Sunaoshi, Takeshi, Nagakubo, Yasuhira
Year of Publication 12.02.2019

Get full text

Patent

Charged Particle Beam Device, Electron Microscope and Sample Observation Method

Charged Particle Beam Device, Electron Microscope and Sample Observation Method

by SUNAOSHI Takeshi, NIMURA Kazutaka, NAGAKUBO Yasuhira
Year of Publication 03.08.2017

Get full text

Patent

Anti-contamination trap, and vacuum application device

Anti-contamination trap, and vacuum application device

by Mizuo, Takashi, Tamba, Yusuke, Nimura, Kazutaka, Hatano, Haruhiko
Year of Publication 23.04.2019

Get full text

Patent

SAMPLE IMAGING METHOD AND CHARGED PARTICLE BEAM SYSTEM

SAMPLE IMAGING METHOD AND CHARGED PARTICLE BEAM SYSTEM

by NIMURA, KAZUTAKA, TAKANE, ATSUSHI, TODOKORO, HIDEO, YAMAGUCHI, SATORU, IIZUMI, TAKASHI, SATO, MITSUGU, OTAKA, TADASHI
Year of Publication 30.05.2003

Get full text

Patent

Mit einem Strahl geladener Teilchen arbeitende Vorrichtung sowie Elektronenmikroskop

Mit einem Strahl geladener Teilchen arbeitende Vorrichtung sowie Elektronenmikroskop

by Nimura, Kazutaka, Sunaoshi, Takeshi, Nagakubo, Yasuhira
Year of Publication 28.01.2021

Get full text

Patent

Anti-Contamination Trap, and Vacuum Application Device

Anti-Contamination Trap, and Vacuum Application Device

by MIZUO TAKASHI, TAMBA YUSUKE, NIMURA KAZUTAKA, HATANO HARUHIKO
Year of Publication 14.07.2016

Get full text

Patent

Kontaminationsverhinderungsfalle und Vakuumanwendungsvorrichtung

Kontaminationsverhinderungsfalle und Vakuumanwendungsvorrichtung

by Mizuo, Takashi, Tamba, Yusuke, Nimura, Kazutaka, Hatano, Haruhiko
Year of Publication 06.08.2020

Get full text

Patent

Mit einem Strahl geladener Teilchen arbeitende Vorrichtung, Elektronenmikroskop und Probenbetrachtungsverfahren

Mit einem Strahl geladener Teilchen arbeitende Vorrichtung, Elektronenmikroskop und Probenbetrachtungsverfahren

by Nimura, Kazutaka, Sunaoshi, Takeshi, Nagakubo, Yasuhira
Year of Publication 24.05.2017

Get full text

Patent

Kontaminationsverhinderungsfalle und Vakuumanwendungsvorrichtung

Kontaminationsverhinderungsfalle und Vakuumanwendungsvorrichtung

by Tamba, Yusuke, Nimura, Kazutaka, Mizuo, Takashi, Hatano, Haruhiko
Year of Publication 04.05.2016

Get full text

Patent

Anti-contamination trap, and vacuum application device

Anti-contamination trap, and vacuum application device

by MIZUO TAKASHI, TAMBA YUSUKE, NIMURA KAZUTAKA, HATANO HARUHIKO
Year of Publication 06.04.2016

Get full text

Patent

Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

by OTAKA TADASHI, SATO MITSUGU, TODOKORO HIDEO, YAMAGUCHI SATORU, NIMURA KAZUTAKA, TAKANE ATSUSHI, IIZUMI TAKASHI
Year of Publication 21.09.2010

Get full text

Patent

Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

by Sato, Mitsugu, Takane, Atsushi, Iizumi, Takashi, Otaka, Tadashi, Todokoro, Hideo, Yamaguchi, Satoru, Nimura, Kazutaka
Year of Publication 21.09.2010

Get full text

Patent

Scanning electron microscope and sample observing method using it

Scanning electron microscope and sample observing method using it

by NAKAGAWA MINE, SATO MITSUGU, TAKEUCHI SHUICHI, NIMURA KAZUTAKA, TAKANE ATSUSHI
Year of Publication 08.11.2005

Get full text

Patent

Scanning electron microscope and sample observing method using it

Scanning electron microscope and sample observing method using it

by Takeuchi, Shuichi, Nakagawa, Mine, Sato, Mitsugu, Takane, Atsushi, Nimura, Kazutaka
Year of Publication 08.11.2005

Get full text

Patent

Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

by OTAKA TADASHI, SATO MITSUGU, TODOKORO HIDEO, YAMAGUCHI SATORU, NIMURA KAZUTAKA, TAKANE ATSUSHI, IIZUMI TAKASHI
Year of Publication 11.09.2008

Get full text

Patent

Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

by Sato, Mitsugu, Takane, Atsushi, Iizumi, Takashi, Otaka, Tadashi, Todokoro, Hideo, Yamaguchi, Satoru, Nimura, Kazutaka
Year of Publication 22.04.2008

Get full text

Patent

Method of forming a sample image and charged particle beam apparatus

Method of forming a sample image and charged particle beam apparatus

by OTAKA TADASHI, SATO MITSUGU, TODOKORO HIDEO, YAMAGUCHI SATORU, NIMURA KAZUTAKA, TAKANE ATSUSHI, IIZUMI TAKASHI
Year of Publication 22.04.2008

Get full text

Patent