by Niewenhuis, Benjamin, Varadarajan, Devanathan
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)

by Duvalsaint, Danielle, Jin, Xiaoxiao, Niewenhuis, Benjamin, Blanton, R. D.
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)

by Varadarajan, Devanathan, Niewenhuis, Benjamin
Year of Publication 10.09.2024

by Blanton, R. D. Shawn, Niewenhuis, Benjamin, Liu, Zeye Dexter
Published in 2015 IEEE International Test Conference (ITC) (01.10.2015)

by Varadarajan, Devanathan, Niewenhuis, Benjamin
Year of Publication 12.10.2023

by Fynan, Phillip, Zeye Liu, Niewenhuis, Benjamin, Mittal, Soumya, Strajwas, Marcin, Blanton, R. D. Shawn
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)

by Blanton, Ronald DeShawn, Niewenhuis, Benjamin
Year of Publication 04.09.2018

by SENGUPTA, Uttam K, NIEWENHUIS, Benjamin, DWARAKANATH, Kumar N
Year of Publication 26.12.2018

by SENGUPTA, Uttam K, NIEWENHUIS, Benjamin, DWARAKANATH, Kumar N
Year of Publication 02.05.2018

by Niewenhuis Benjamin, Sengupta Uttam K, Dwarakanath Kumar N
Year of Publication 27.06.2017

by Niewenhuis Benjamin, Sengupta Uttam K, Dwarakanath Kumar N
Year of Publication 29.12.2016

by SENGUPTA, Uttam K, NIEWENHUIS, Benjamin, DWARAKANATH, Kumar N
Year of Publication 29.12.2016

by NIEWENHUIS BENJAMIN, SENGUPTA UTTAM K, DWARAKANATH KUMAR N
Year of Publication 09.02.2018