Low-temperature annealing of As-implanted Ge
HATTANGADY, S. V, FOUNTAIN, G. G, NICOLLIAN, E. H, MARKUNAS, R. J
Published in Journal of applied physics (1988)
Published in Journal of applied physics (1988)
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Journal Article
Generalized guide for MOSFET miniaturization
Brews, J.R., Fichtner, W., Nicollian, E.H., Sze, S.M.
Published in IEEE electron device letters (01.01.1980)
Published in IEEE electron device letters (01.01.1980)
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Journal Article
Chemical etching of Ge for differential hall measurements
HATTANGADY, S. V, NICOLLIAN, E. H, MARKUNAS, R. J
Published in Journal of the Electrochemical Society (01.06.1987)
Published in Journal of the Electrochemical Society (01.06.1987)
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Journal Article
Electrochemical Charging of Thermal SiO2 Films by Injected Electron Currents
Nicollian, E. H., Berglund, C. N., Schmidt, P. F., Andrews, J. M.
Published in Journal of applied physics (01.12.1971)
Published in Journal of applied physics (01.12.1971)
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Journal Article
The modelling of silicon oxidation from 1×10-5 to 20 atmospheres
REISMAN, A, NICOLLIAN, E. H, WILLIAMS, C. K, MERZ, C. J
Published in Journal of electronic materials (1987)
Published in Journal of electronic materials (1987)
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