The use of SIMS, SEM, EPMA, LRS and X-ray diffraction measurements for the examination of corrosive layers and protective coatings on steels and alloys in advanced power stations
NICKEL, Hubertus, NIEWOLAK, Leszek, ZUREK, Joanna, QUADAKKERS, Willem J
Published in Mikrochimica acta (1966) (01.12.2004)
Published in Mikrochimica acta (1966) (01.12.2004)
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Journal Article
The oxidation behaviour of niobium containing ?-TiAl based intermetallics in air and argon/oxygen
Nickel, Hubertus, Zheng, Nanxi, Elschner, Andreas, Quadakkers, Willem J.
Published in Mikrochimica acta (1966) (01.03.1995)
Published in Mikrochimica acta (1966) (01.03.1995)
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Journal Article
ICP-AES detection of silicon carbide impurities volatilized in a graphite furnace with the use of carbon tetrachloride vapour
ZARAY, G, KANTOR, T, WOLFF, G, ZADGORSKA, Z, NICKEL, H
Published in Mikrochimica acta (1966) (01.05.1992)
Published in Mikrochimica acta (1966) (01.05.1992)
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Journal Article
Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In sub 0 sub . sub 5 sub 2 Al sub 0 sub . sub 4 sub 8 As and In sub 0 sub . sub 5 sub 3 Al sub x Ga sub 0 sub . sub 4 sub 7 sub - sub x As on InP in the wavelength range from 280 to 1900 nm
Dinges, H W, Burkhard, H, Losch, R, Nickel, Hubertus, Schlapp, W
Published in Thin solid films (01.01.1993)
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Published in Thin solid films (01.01.1993)
Journal Article
Stresses in alumina scales on NiCrAlY-alloys determined by XSE and LRS
VOSBERG, V. R, BERGER, M. G, FISCHER, W, QUADAKKERS, W. J, NICKEL, H
Published in Mikrochimica acta (1966) (01.01.1997)
Published in Mikrochimica acta (1966) (01.01.1997)
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