β-Gallium oxide power electronics
Green, Andrew J., Speck, James, Xing, Grace, Moens, Peter, Allerstam, Fredrik, Gumaelius, Krister, Neyer, Thomas, Arias-Purdue, Andrea, Mehrotra, Vivek, Kuramata, Akito, Sasaki, Kohei, Watanabe, Shinya, Koshi, Kimiyoshi, Blevins, John, Bierwagen, Oliver, Krishnamoorthy, Sriram, Leedy, Kevin, Arehart, Aaron R., Neal, Adam T., Mou, Shin, Ringel, Steven A., Kumar, Avinash, Sharma, Ankit, Ghosh, Krishnendu, Singisetti, Uttam, Li, Wenshen, Chabak, Kelson, Liddy, Kyle, Islam, Ahmad, Rajan, Siddharth, Graham, Samuel, Choi, Sukwon, Cheng, Zhe, Higashiwaki, Masataka
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Published in APL materials (01.02.2022)
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Early Prediction of Prognosis in Elderly Acute Stroke Patients
Bautista, Alexander F, Lenhardt, Rainer, Yang, Dongsheng, Yu, Changhong, Heine, Michael F, Mascha, Edward J, Heine, Cate, Neyer, Thomas M, Remmel, Kerri, Akca, Ozan
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Published in Critical care explorations (01.04.2019)
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Published in Materials science forum (31.05.2022)
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Origins of Soft-Switching Coss Losses in SiC Power MOSFETs and Diodes for Resonant Converter Applications
Tong, Zikang, Roig-Guitart, Jaume, Neyer, Thomas, Plummer, James D., Rivas-Davila, Juan M.
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2021)
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2021)
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Origins of Soft-Switching C oss Losses in SiC Power MOSFETs and Diodes for Resonant Converter Applications
Tong, Zikang, Roig-Guitart, Jaume, Neyer, Thomas, Plummer, James D., Rivas-Davila, Juan M.
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2021)
Published in IEEE journal of emerging and selected topics in power electronics (01.08.2021)
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KIM KI MIN, PARK KYEONGSEOK, LEE BONGYONG, CHOI DOOJIN, NEYER THOMAS, CHO KEVIN
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LIM JANGKWON, ALLERSTAM FREDRIK, ROIG GUITART JAUME, KONSTANTINOV ANDREI, NEYER THOMAS, DOMEIJ MARTIN
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Year of Publication 16.08.2023
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H3TRB Test on 650 V SiC JBS Diodes
Kaminski, Nando, Allerstam, Fredrik, Neyer, Thomas, Hoffmann, Felix, Hanf, Michael, Konstantinov, Andrei, Zorn, Christian
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Effect of Phosphorus Doped Poly Annealing on Threshold Voltage Stability and Thermal Oxide Reliability in 4H-SiC MOSFET
Allerstam, Fredrik, Lee, Taeseop, Neyer, Thomas, Lee, Kwangwon, Park, Kyeong Seok, Domeij, Martin, Seo, Young Ho
Published in Materials science forum (28.07.2020)
Published in Materials science forum (28.07.2020)
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Detection of crystal defects in high doped epitaxial layers and substrates by photoluminescence
Das, Hrishikesh, Sunkari, Swapna, Naas, Hans, Domeij, Martin, Konstantinov, Andrei, Allerstam, Fredrik, Neyer, Thomas
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
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Critical temperature and failure mechanism of SiC Schottky rectifiers in Unclamped Inductive Switching (UIS)
Konstantinov, Andrei, Allerstam, Fredrik, Pham, Helen, Park, George, Park, K.S., Waible, Daniel, Neyer, Thomas
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
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Silicon Carbide Schottky Rectifiers with Improved Avalanche Ruggedness
Allerstam, Fredrik, Akram, Sal, Lee, Brian, Neyer, Thomas, Jinman, Song, Konstantinov, Andrei, Young, Sungmo
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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A physically based scalable SPICE model for silicon carbide power MOSFETs
Canzhong He, Victory, James, Yazdi, Mehrdad Baghaie, Kwangwon Lee, Domeij, Martin, Allerstam, Fredrik, Neyer, Thomas
Published in 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2017)
Published in 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) (01.03.2017)
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Conference Proceeding
(Invited) Enabling SiC Yield and Reliability through Epitaxy and Characterization
Das, Hrishikesh, Sunkari, Swapna, Domeij, Martin, Konstantinov, Andrei, Allerstam, Fredrik, Neyer, Thomas
Published in ECS transactions (21.09.2015)
Published in ECS transactions (21.09.2015)
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