Calibration of Burnup Monitor Installed in Rokkasho Reprocessing Plant
OEDA, Kaoru, NAITO, Hirofumi, HIROTA, Masanari, NATSUME, Koichiro, KUMANOMIDO, Hironori
Published in Journal of nuclear science and technology (01.06.2000)
Published in Journal of nuclear science and technology (01.06.2000)
Get full text
Journal Article
Calibration of Burnup Monitor Installed in Rokkasho Reprocessing Plant
OEDA, Kaoru, NAITO, Hirofumi, HIROTA, Masanari, NATSUME, Koichiro, KUMANOMIDO, Hironori
Published in Journal of nuclear science and technology (01.06.2000)
Published in Journal of nuclear science and technology (01.06.2000)
Get full text
Journal Article
Application of high-quality built-in test to industrial designs
Hatayama, K., Nakao, M., Kiyoshige, Y., Natsume, K., Sato, Y., Nagumo, T.
Published in Proceedings - International Test Conference (2002)
Published in Proceedings - International Test Conference (2002)
Get full text
Conference Proceeding
Test method of semiconductor integrated circuit and test pattern generating circuit
KOUNO, MASAKI, HATAKEYAMA, KAZUMI, NATSUME, KOICHIRO, KIYOSHIGE, KENICHI, NAKAO, NORINOBU
Year of Publication 11.08.2003
Get full text
Year of Publication 11.08.2003
Patent
METHOD OF CREATING INITIAL INPUT VECTOR OF TEST GENERATION CIRCUIT
NATSUME KOICHIRO, HATAKEYAMA KAZUMI, KIYOSHIGE KENICHI, NAKAO NORINOBU
Year of Publication 06.09.2002
Get full text
Year of Publication 06.09.2002
Patent
Test method of semiconductor intergrated circuit and test pattern generator
HAMAMOTO MASATO, HATAYAMA KAZUMI, NATSUME KOICHIRO, YOSHIDA HIDEFUMI, NAKAMURA TOMOJI, KIYOSHIGE YOSHIKAZU, NAKAO MICHINOBU, KOUNO MASAKI
Year of Publication 26.07.2005
Get full text
Year of Publication 26.07.2005
Patent
Test method of semiconductor intergrated circuit and test pattern generator
HAMAMOTO MASATO, HATAYAMA KAZUMI, NATSUME KOICHIRO, YOSHIDA HIDEFUMI, NAKAMURA TOMOJI, KIYOSHIGE YOSHIKAZU, NAKAO MICHINOBU, KOUNO MASAKI
Year of Publication 13.06.2002
Get full text
Year of Publication 13.06.2002
Patent