Search Results - "NARASAKI WATARU" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

$A Refractory Cutaneous Abscess$

A Refractory Cutaneous Abscess

by Maya, Yuka, Narasaki, Wataru, Maeda, Yoshiaki, Ota, Mitsuhito
Published in The American journal of medicine (01.06.2018)

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Journal Article

STRUCTURE, FOUNDATION STRUCTURE, CONSTRUCTION METHOD OF FOUNDATION STRUCTURE, AND CONSTRUCTION METHOD OF BUILDING

STRUCTURE, FOUNDATION STRUCTURE, CONSTRUCTION METHOD OF FOUNDATION STRUCTURE, AND CONSTRUCTION METHOD OF BUILDING

by TOMIZAWA YOSUKE, NARASAKI WATARU, MIYASHITA TAKASHI, OIKAWA NAOYA
Year of Publication 27.06.2022

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Patent

TESTER AND TEST METHOD

TESTER AND TEST METHOD

by FUJINO MASAO, NARASAKI WATARU, TANAKA TAKESHI, KAKINUMA FUMIKAZU, HAYAKAWA TOSHIAKI, NAKAGAWA MASARU, KURIHARA HIROSHI, NAKAMURA TAKAHIRO
Year of Publication 04.06.2020

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Patent

CONDUCTIVE FILM

CONDUCTIVE FILM

by FUJINO MASAO, NARASAKI WATARU, TANAKA TAKESHI, KAKINUMA FUMIKAZU, HAYAKAWA TOSHIAKI, NAKAGAWA MASARU, KURIHARA HIROSHI, NAKAMURA TAKAHIRO
Year of Publication 04.06.2020

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Patent

METHOD FOR CONNECTING PROBE PIN TO WIRING BOARD, AND MANUFACTURING METHOD OF PROBE CARD

METHOD FOR CONNECTING PROBE PIN TO WIRING BOARD, AND MANUFACTURING METHOD OF PROBE CARD

by NARASAKI WATARU, SAITO TADAO
Year of Publication 02.07.2004

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Patent

DRAWING ERROR CORRECTING METHOD FOR ELECTRON BEAM EXPOSURE APPARATUS

DRAWING ERROR CORRECTING METHOD FOR ELECTRON BEAM EXPOSURE APPARATUS

by NARASAKI WATARU
Year of Publication 25.09.1990

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Patent

SEMICONDUCTOR LASER

SEMICONDUCTOR LASER

by NARASAKI WATARU, WATABE TAKASHI
Year of Publication 15.08.1997

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Patent

PROBE CARD, MANUFACTURING METHOD OF PROBE CARD, AND CONTACT

PROBE CARD, MANUFACTURING METHOD OF PROBE CARD, AND CONTACT

by WADA KOICHI, NARASAKI WATARU, KITATSUME HIDENORI
Year of Publication 03.12.2003

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Patent

SPUTTERING TARGET, MANUFACTURING METHOD THEREFOR, AND METHOD FOR MANUFACTURING ALLOY FILM AND PROBE PIN

SPUTTERING TARGET, MANUFACTURING METHOD THEREFOR, AND METHOD FOR MANUFACTURING ALLOY FILM AND PROBE PIN

by NARASAKI WATARU, MOTOYAMA SHINICHI, KITATSUME HIDENORI
Year of Publication 15.01.2003

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Patent

PROBE CARD, CONTACT, CONTACT MANUFACTURING METHOD, AND PROBE CARD MANUFACTURING METHOD

PROBE CARD, CONTACT, CONTACT MANUFACTURING METHOD, AND PROBE CARD MANUFACTURING METHOD

by NARASAKI WATARU, TAKOJIMA TAKENAO, HATA SEIICHI, SHIMOKAWABE AKIRA
Year of Publication 02.09.2005

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Patent

METHOD FOR EVALUATING SEMICONDUCTOR LASER

METHOD FOR EVALUATING SEMICONDUCTOR LASER

by NARASAKI WATARU, SYNG BIRAHAM PAL, SATO SEIYA
Year of Publication 02.07.1999

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Patent

MEASUREMENT OF LASING WAVELENGTH OF DISTRIBUTED REFLECTION TYPE LASER AND METHOD OF DESIGN

MEASUREMENT OF LASING WAVELENGTH OF DISTRIBUTED REFLECTION TYPE LASER AND METHOD OF DESIGN

by SYNG BIRAHAM PAL, NARASAKI WATARU, SATO SEIYA
Year of Publication 02.06.1999

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Patent

STRUCTURE OF BRAGG REFLECTOR AND OPTICAL ELEMENT WITH THE STRUCTURE OF THE REFLECTOR

STRUCTURE OF BRAGG REFLECTOR AND OPTICAL ELEMENT WITH THE STRUCTURE OF THE REFLECTOR

by NARASAKI WATARU, SATO SEIYA, SYNGE BIRAHAMU PAL
Year of Publication 30.03.1999

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Patent

SEMICONDUCTOR MULTILAYERED FILM REFLECTION MIRROR AND ITS PRODUCTION

SEMICONDUCTOR MULTILAYERED FILM REFLECTION MIRROR AND ITS PRODUCTION

by NARASAKI WATARU, SING VIRAHAMPAL, SATO SEIYA
Year of Publication 18.12.1998

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Patent

METHOD OF MANUFACTURING PROBE PIN AND METHOD OF MANUFACTURING PROBE CARD

METHOD OF MANUFACTURING PROBE PIN AND METHOD OF MANUFACTURING PROBE CARD

by NARASAKI WATARU, TAKOJIMA TAKENAO, HATA SEIICHI, SHIMOKAWABE AKIRA
Year of Publication 04.12.2002

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Patent

MBE APPARATUS AND FILM THICKNESS MEASURING METHOD OF EPITAXIALLY GROWN FILM

MBE APPARATUS AND FILM THICKNESS MEASURING METHOD OF EPITAXIALLY GROWN FILM

by SYNG BIRAHAM PAL, NARASAKI WATARU, SAKURAI TAKAO, SATO SEIYA
Year of Publication 19.10.1999

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Patent

REFLECTIVITY METER

REFLECTIVITY METER

by NARASAKI WATARU, WATABE TAKASHI, SATO SEIYA, SYNGE BIRAHAMU PAL
Year of Publication 11.09.1998

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Patent

ELECTRON BEAM EXPOSURE APPARATUS

ELECTRON BEAM EXPOSURE APPARATUS

by HOSOMATSU HARUO, NARASAKI WATARU, SUEHIRO MASAYUKI
Year of Publication 25.09.1990

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Patent

OPTIC SAMPLER MODULE AND SAMPLING WAVEFORM MEASURING APPARATUS USING THE SAME

OPTIC SAMPLER MODULE AND SAMPLING WAVEFORM MEASURING APPARATUS USING THE SAME

by NARASAKI WATARU, SAKURAI TAKAO, HASHIMOTO SHOICHI, SASAKI KOJI
Year of Publication 14.02.1997

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Patent