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A test solution for oxide thickness variations in the ATMEL TSTAC™ eFlash technology
Mauroux, P.-D, Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Godard, B., Festes, G., Vachez, L.
Published in 2011 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (01.04.2011)
Published in 2011 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (01.04.2011)
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Conference Proceeding
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories
Mauroux, P.-D., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Godard, B., Festes, G., Vachez, L.
Published in Journal of electronic testing (01.04.2012)
Published in Journal of electronic testing (01.04.2012)
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Journal Article