Revival of Ferroelectric Memories Based on Emerging Fluorite-Structured Ferroelectrics
Park, Ju Yong, Choe, Duk-Hyun, Lee, Dong Hyun, Yu, Geun Taek, Yang, Kun, Kim, Se Hyun, Park, Geun Hyeong, Nam, Seung-Geol, Lee, Hyun Jae, Jo, Sanghyun, Kuh, Bong Jin, Ha, Daewon, Kim, Yongsung, Heo, Jinseong, Park, Min Hyuk
Published in Advanced materials (Weinheim) (01.10.2023)
Published in Advanced materials (Weinheim) (01.10.2023)
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Journal Article
Breakdown of the interlayer coherence in twisted bilayer graphene
Kim, Youngwook, Yun, Hoyeol, Nam, Seung-Geol, Son, Minhyeok, Lee, Dong Su, Kim, Dong Chul, Seo, S, Choi, Hee Cheul, Lee, Hu-Jong, Lee, Sang Wook, Kim, Jun Sung
Published in Physical review letters (27.02.2013)
Published in Physical review letters (27.02.2013)
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Journal Article
Local and Nonlocal Fraunhofer-like Pattern from an Edge-Stepped Topological Surface Josephson Current Distribution
Lee, Jae Hyeong, Lee, Gil-Ho, Park, Joonbum, Lee, Janghee, Nam, Seung-Geol, Shin, Yun-Sok, Kim, Jun Sung, Lee, Hu-Jong
Published in Nano letters (10.09.2014)
Published in Nano letters (10.09.2014)
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Journal Article
Potential role of motion for enhancing maximum output energy of triboelectric nanogenerator
Byun, Kyung-Eun, Lee, Min-Hyun, Cho, Yeonchoo, Nam, Seung-Geol, Shin, Hyeon-Jin, Park, Seongjun
Published in APL materials (01.07.2017)
Published in APL materials (01.07.2017)
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Journal Article
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET
Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Unexpectedly low barrier of ferroelectric switching in HfO2 via topological domain walls
Choe, Duk-Hyun, Kim, Sunghyun, Moon, Taehwan, Jo, Sanghyun, Bae, Hagyoul, Nam, Seung-Geol, Lee, Yun Seong, Heo, Jinseong
Published in Materials today (Kidlington, England) (01.11.2021)
Published in Materials today (Kidlington, England) (01.11.2021)
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Journal Article
Revival of Ferroelectric Memories Based on Emerging Fluorite‐Structured Ferroelectrics (Adv. Mater. 43/2023)
Park, Ju Yong, Choe, Duk‐Hyun, Lee, Dong Hyun, Yu, Geun Taek, Yang, Kun, Kim, Se Hyun, Park, Geun Hyeong, Nam, Seung‐Geol, Lee, Hyun Jae, Jo, Sanghyun, Kuh, Bong Jin, Ha, Daewon, Kim, Yongsung, Heo, Jinseong, Park, Min Hyuk
Published in Advanced materials (Weinheim) (01.10.2023)
Published in Advanced materials (Weinheim) (01.10.2023)
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Journal Article
Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND
Lim, Suhwan, Kim, Taeyoung, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Kim, Juhyung, Jung, Dongjin, Kim, Kwangsoo, Yoo, Sijung, Lee, Hyun Jae, Nam, Seung-Geol, Kim, Ji-Sung, Park, Jaewoo, Kim, Chaeho, Kim, Seunghyun, Kim, Hyoseok, Heo, Jinseong, Park, Kwangmin, Jeon, Sanghun, Kim, Wanki, Ha, Daewon, Shin, Yu Gyun, Song, Jaihyuk
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding
Graphene Capping of Cu Back-End-of-Line Interconnects Reduces Resistance and Improves Electromigration Lifetime
Shin, Keun Wook, Cho, Yeonchoo, Nam, Seung-Geol, Jung, Alum, Lee, Eun-Kyu, Lee, Chang-Seok, Lee, Min-Hyun, Shin, Hyeon-Jin, Byun, Kyung-Eun
Published in ACS applied nano materials (24.03.2023)
Published in ACS applied nano materials (24.03.2023)
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Journal Article
Ballistic transport of graphene pnp junctions with embedded local gates
Nam, Seung-Geol, Ki, Dong-Keun, Park, Jong Wan, Kim, Youngwook, Kim, Jun Sung, Lee, Hu-Jong
Published in Nanotechnology (14.10.2011)
Published in Nanotechnology (14.10.2011)
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Journal Article
Study of selective graphene growth on non-catalytic hetero-substrates
Wook Shin, Keun, Cho, Yeonchoo, Lee, Yunseong, Lee, Hyangsook, Nam, Seung-Geol, Byun, Kyung-Eun, Lee, Chang-Seok, Park, Seongjun, Shin, Hyeon-Jin
Published in 2d materials (01.01.2020)
Published in 2d materials (01.01.2020)
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Journal Article
Barrier height control in metal/silicon contacts with atomically thin MoS2 and WS2 interfacial layers
Nam, Seung-Geol, Cho, Yeonchoo, Lee, Min-Hyun, Shin, Keun Wook, Kim, Changhyun, Yang, Kiyeon, Jeong, Myoungho, Shin, Hyeon-Jin, Park, Seongjun
Published in 2d materials (01.10.2018)
Published in 2d materials (01.10.2018)
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Journal Article
Semiconductor device including ferroelectrics and electronic apparatus including the semiconductor device
LEE, YUN SEONG, HEO, JIN SEONG, LEE, HYUN JAE, CHOE, DUK HYUN, NAM, SEUNG GEOL
Year of Publication 22.07.2024
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Year of Publication 22.07.2024
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