Search Results - "NAKAYAMA, KOHICHI" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Evaluation of shielding performance and light emission characteristics of luminescent radiation shields using Gd 2 O 2 S

Evaluation of shielding performance and light emission characteristics of luminescent radiation shields using Gd 2 O 2 S

by Nakayama, Kohichi, Nittoh, Koichi, Fukuta, Yukihiro, Kamiyama, Takashi, Sato, Hirotaka, Kiyanagi, Yoshiaki
Published in Journal of nuclear science and technology (25.06.2024)

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Journal Article

Cosmic-ray muon radiography of UO2 fuel assembly

Cosmic-ray muon radiography of UO2 fuel assembly

by Sugita, Tsukasa, Bacon, Jeffery, Ban, Yuichiro, Borozdin, Konstantin, Izumi, Mikio, Karino, Yoshiji, Kume, Naoto, Miyadera, Haruo, Mizokami, Shinya, Morris, Christopher L., Nakayama, Kohichi, Otsuka, Yasuyuki, Perry, John O., Ramsey, John, Sano, Yuji, Yamada, Daichi, Yoshida, Noriyuki, Yoshioka, Kenichi
Published in Journal of nuclear science and technology (03.08.2014)

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Journal Article

Cosmic-ray muon radiography of UO 2 fuel assembly

Cosmic-ray muon radiography of UO 2 fuel assembly

by Sugita, Tsukasa, Bacon, Jeffery, Ban, Yuichiro, Borozdin, Konstantin, Izumi, Mikio, Karino, Yoshiji, Kume, Naoto, Miyadera, Haruo, Mizokami, Shinya, Morris, Christopher L., Nakayama, Kohichi, Otsuka, Yasuyuki, Perry, John O., Ramsey, John, Sano, Yuji, Yamada, Daichi, Yoshida, Noriyuki, Yoshioka, Kenichi
Published in Journal of nuclear science and technology (03.08.2014)

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Journal Article

METHOD AND PROGRAM FOR DETERMINIOMPLEMENTARY DIVISION CONDITION AND COMPLEMENTARY DIVING METHOD TO CONTROL PATTERN DISPLACEMENT AND MASK BREAKDOWN OF STENCIL MASK

METHOD AND PROGRAM FOR DETERMINIOMPLEMENTARY DIVISION CONDITION AND COMPLEMENTARY DIVING METHOD TO CONTROL PATTERN DISPLACEMENT AND MASK BREAKDOWN OF STENCIL MASK

by ASHIDA ISAO, NAKAYAMA KOHICHI
Year of Publication 25.10.2004

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Patent

MASK PROCESSING DEVICE, MASK PROCESSING METHOD, PROGRAM, AND MASK

MASK PROCESSING DEVICE, MASK PROCESSING METHOD, PROGRAM, AND MASK

by NAKAYAMA, KOHICHI, ASHIDA, ISAO
Year of Publication 19.08.2004

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Patent

NEUTRON AND GAMMA-RAY COLLIMATOR AND RADIOGRAPHY DEVICE

NEUTRON AND GAMMA-RAY COLLIMATOR AND RADIOGRAPHY DEVICE

by SONODA, Yukio, UEMATSU, Mikio, NAKAYAMA, Kohichi, NITTOH, Koichi
Year of Publication 18.09.2024

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Patent

NEUTRON AND GAMMA-RAY COLLIMATOR AND RADIOGRAPHY DEVICE

NEUTRON AND GAMMA-RAY COLLIMATOR AND RADIOGRAPHY DEVICE

by SONODA, Yukio, UEMATSU, Mikio, NAKAYAMA, Kohichi, NITTOH, Koichi
Year of Publication 27.12.2023

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Patent

RADIATION-SCINTILLATED SHIELD AND MANUFACTURING METHOD OF RADIATION SHIELDING RESIN

RADIATION-SCINTILLATED SHIELD AND MANUFACTURING METHOD OF RADIATION SHIELDING RESIN

by SONODA, Yukio, NAKAYAMA, Kohichi, FUKUTA, Yukihiro, NITTOH, Koichi
Year of Publication 29.09.2022

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Patent

RADIATION-SCINTILLATED SHIELD AND MANUFACTURING METHOD OF RADIATION SHIELDING RESIN

RADIATION-SCINTILLATED SHIELD AND MANUFACTURING METHOD OF RADIATION SHIELDING RESIN

by SONODA, Yukio, NAKAYAMA, Kohichi, FUKUTA, Yukihiro, NITTOH, Koichi
Year of Publication 07.09.2022

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Patent

Optical proximity correction method, optical proximity correction apparatus, and optical proximity correction program, method of manufacturing semiconductor device, design rule formulating method, and optical proximity correction condition calculating method

Optical proximity correction method, optical proximity correction apparatus, and optical proximity correction program, method of manufacturing semiconductor device, design rule formulating method, and optical proximity correction condition calculating method

by NAKAYAMA KOHICHI, KOIKE KAORU
Year of Publication 21.09.2010

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Patent

Optical proximity correction method, optical proximity correction apparatus, and optical proximity correction program, method of manufacturing semiconductor device, design rule formulating method, and optical proximity correction condition calculating method

Optical proximity correction method, optical proximity correction apparatus, and optical proximity correction program, method of manufacturing semiconductor device, design rule formulating method, and optical proximity correction condition calculating method

by Koike, Kaoru, Nakayama, Kohichi
Year of Publication 21.09.2010

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Patent

OPTICAL PROXIMITY CORRECTION METHOD, OPTICAL PROXIMITY CORRECTION APPARATUS, AND OPTICAL PROXIMITY CORRECTION PROGRAM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, DESIGN RULE FORMULATING METHOD, AND OPTICAL PROXIMITY CORRECTION CONDITION CALCULATING METHOD

OPTICAL PROXIMITY CORRECTION METHOD, OPTICAL PROXIMITY CORRECTION APPARATUS, AND OPTICAL PROXIMITY CORRECTION PROGRAM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, DESIGN RULE FORMULATING METHOD, AND OPTICAL PROXIMITY CORRECTION CONDITION CALCULATING METHOD

by NAKAYAMA KOHICHI, KOIKE KAORU
Year of Publication 23.10.2008

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Patent

Muon tracker and muon tracking method

Muon tracker and muon tracking method

by Kume Naoto, Yoshioka Kenichi, Ban Yuichiro, Sugita Tsukasa, Miyadera Haruo, Nakayama Kohichi
Year of Publication 01.08.2017

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Patent

MUON TRACKER AND MUON TRACKING METHOD

MUON TRACKER AND MUON TRACKING METHOD

by YOSHIOKA Kenichi, KUME Naoto, BAN Yuichiro, NAKAYAMA Kohichi, SUGITA Tsukasa, MIYADERA Haruo
Year of Publication 29.12.2016

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Patent

Complementary division condition determining method and program and complementary division method

Complementary division condition determining method and program and complementary division method

by NAKAYAMA, KOHICHI, ASHIDA, ISAO
Year of Publication 20.06.2007

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Patent

Mask processing device, mask processing method, program and mask

Mask processing device, mask processing method, program and mask

by ASHIDA ISAO, NAKAYAMA KOHICHI
Year of Publication 29.06.2006

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Patent

Mask processing apparatus, mask processing method, program and mask

Mask processing apparatus, mask processing method, program and mask

by NAKAYAMA, KOHICHI, ASHIDA, ISAO
Year of Publication 01.04.2006

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Patent

Complementary division condition determining method and program and complementary division method

Complementary division condition determining method and program and complementary division method

by ASHIDA ISAO, NAKAYAMA KOHICHI
Year of Publication 07.03.2006

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Patent

Complementary division condition determining method and program and complementary division method

Complementary division condition determining method and program and complementary division method

by Ashida, Isao, Nakayama, Kohichi
Year of Publication 07.03.2006

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Patent

Complementary division condition determining method and program and complementary division method

Complementary division condition determining method and program and complementary division method

by NAKAYAMA, KOHICHI, ASHIDA, ISAO
Year of Publication 22.02.2006

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Patent