A Hybrid Indirect ToF Image Sensor for Long-Range 3D Depth Measurement under High Ambient Light Conditions
Hatakeyama, Kunihiro, Okubo, Yu, Nakagome, Tomohiro, Makino, Masahiro, Takashima, Hiroshi, Akutsu, Takahiro, Sawamoto, Takehide, Nagase, Masanori, Noguchi, Tatsuo, Kawahito, Shoji
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)
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Conference Proceeding
A Hybrid ToF Image Sensor for Long-Range 3D Depth Measurement Under High Ambient Light Conditions
Hatakeyama, Kunihiro, Okubo, Yu, Nakagome, Tomohiro, Makino, Masahiro, Takashima, Hiroshi, Akutsu, Takahiro, Sawamoto, Takehide, Nagase, Masanori, Noguchi, Tatsuo, Kawahito, Shoji
Published in IEEE journal of solid-state circuits (01.04.2023)
Published in IEEE journal of solid-state circuits (01.04.2023)
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Journal Article