QED: Quick Error Detection tests for effective post-silicon validation
Hong, T, Li, Y, Sung-Boem Park, Mui, D, Lin, D, Kaleq, Z A, Hakim, N, Naeimi, H, Gardner, D S, Mitra, S
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Fault Secure Encoder and Decoder for NanoMemory Applications
Naeimi, H., DeHon, A.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2009)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2009)
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Journal Article
Low-cost program-level detectors for reducing silent data corruptions
Hari, S. K. S., Adve, S. V., Naeimi, H.
Published in IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) (01.06.2012)
Published in IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) (01.06.2012)
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Conference Proceeding
A Model Study of Defects and Faults in Embedded Spin Transfer Torque (STT) MRAM Arrays
Chintaluri, Ashwin, Parihar, Abhinav, Natarajan, Suriyaprakash, Naeimi, Helia, Raychowdhury, Arijit
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Relyzer: Application Resiliency Analyzer for Transient Faults
Sastry Hari, Siva Kumar, Adve, S. V., Naeimi, H., Ramachandran, P.
Published in IEEE MICRO (01.05.2013)
Published in IEEE MICRO (01.05.2013)
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Journal Article
GangES: Gang error simulation for hardware resiliency evaluation
Hari, Siva Kumar Sastry, Venkatagiri, Radha, Adve, Sarita V., Naeimi, Helia
Published in 2014 ACM/IEEE 41st International Symposium on Computer Architecture (ISCA) (01.06.2014)
Published in 2014 ACM/IEEE 41st International Symposium on Computer Architecture (ISCA) (01.06.2014)
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Conference Proceeding
Design techniques for cross-layer resilience
Carter, Nicholas P, Naeimi, Helia, Gardner, Donald S
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
Published in 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) (01.03.2010)
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Conference Proceeding
Innovative practices session 5C: Cloud atlas - Unreliability through massive connectivity
Naeimi, Helia, Natarajan, Suriya, Vaid, Kushagra, Kudva, Prabhakar, Natu, Mahesh
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
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Conference Proceeding