Configurable BISR Chain For Fast Repair Data Loading
Zou, Wei, Nadeau-Dostie, Benoit
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
Test point insertion using functional flip-flops to drive control points
Joon-Sung Yang, Nadeau-Dostie, B., Touba, N.A.
Published in 2009 International Test Conference (01.11.2009)
Published in 2009 International Test Conference (01.11.2009)
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Conference Proceeding
Memory repair logic sharing techniques and their impact on yield
Nadeau-Dostie, Benoit, Romain, Luc
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Low-Power Programmable PRPG With Test Compression Capabilities
Filipek, Michal, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2015)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2015)
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Journal Article
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing
Yun, Jongsin, Nadeau-Dostie, Benoit, Keim, Martin, Schramm, Lori, Dray, Cyrille, Boujamaa, Mehdi, Gelda, Khushal
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
VLSI Test Principles and Architectures
Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Nur A. Touba, Erik H. Volkerink, Duncan Walker, Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Shianling Wu
Year of Publication 14.08.2006
Year of Publication 14.08.2006
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eBook
Transitioning eMRAM from Pilot Project to Volume Production
Dray, Cyrille, Gelda, Khushal, Nadeau-Dostie, Benoit, Zou, Wei, Romain, Luc, Yun, Ongsin, Kodali, Harshitha, Schramm, Lori, Keim, Martin
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops
Joon-Sung Yang, Touba, N. A., Nadeau-Dostie, B.
Published in IEEE transactions on computers (01.10.2012)
Published in IEEE transactions on computers (01.10.2012)
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Journal Article
Adapting an industrial memory BIST solution for testing CAMs
Abraham, Jais, Garg, Uttam, Colon-Bonet, Glenn, Sharma, Ramesh, Chennian Di, Nadeau-Dostie, Benoit, Racine, Etienne, Keim, Martin
Published in 2017 International Test Conference in Asia (ITC-Asia) (01.09.2017)
Published in 2017 International Test Conference in Asia (ITC-Asia) (01.09.2017)
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Conference Proceeding
Test generator with preselected toggling for low power built-in self-test
Rajski, J., Tyszer, J., Mrugalski, G., Nadeau-Dostie, B.
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
Published in 2012 IEEE 30th VLSI Test Symposium (VTS) (01.04.2012)
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Conference Proceeding
Combining Built-In Redundancy Analysis with ECC for Memory Testing
Romain, Luc, Nordmann, Paul-Patrick, Nadeau-Dostie, Benoit, Schramm, Lori, Keim, Martin
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
Published in 2024 IEEE European Test Symposium (ETS) (20.05.2024)
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Conference Proceeding