Radiation Hardened Millimeter-Wave Receiver Implemented in 90-nm, SiGe HBT Technology
Al Seragi, Ebrahim M., Dash, Subhra, Muthuseenu, K., Cressler, John D., Barnaby, Hugh J., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Zeinolabedinzadeh, Saeed
Published in IEEE transactions on nuclear science (01.10.2022)
Published in IEEE transactions on nuclear science (01.10.2022)
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Journal Article
Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs
Muthuseenu, K., Barnaby, H. J., Galloway, K. F., Koziukov, A. E., Maksimenko, T. A., Vyrostkov, M. Y., Bu-Khasan, K. B., Kalashnikova, A. A., Privat, A.
Published in IEEE transactions on electron devices (01.08.2021)
Published in IEEE transactions on electron devices (01.08.2021)
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Journal Article
Analysis of Total Ionizing Dose Effects Using Electron Holography
Chang, C. T., Apsangi, P., Muthuseenu, K., Privat, A., Kennedy, B., McCartney, M. R., Smith, D. J., Holbert, K. E., Barnaby, H. J.
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Analysis of SEGR in Silicon Planar Gate Super-Junction Power MOSFETs
Muthuseenu, K., Barnaby, H. J., Galloway, K. F., Koziukov, A. E., Maksimenko, T. A., Vyrostkov, M. Y., Bu-Khasan, K. B., Kalashnikova, A. A., Privat, A.
Published in IEEE transactions on nuclear science (01.05.2021)
Published in IEEE transactions on nuclear science (01.05.2021)
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Journal Article
Temperature Response on NPN and PNP Bipolar Junction Transistors after Total Ionizing Dose Irradiation Exposure
Privat, A., Barnaby, H. J., Tolleson, B. S., Muthuseenu, K., Adell, P.C.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Ionizing radiation tolerance of stacked Si3N4-SiO2 gate insulators for power MOSFETs
Muthuseenu, K., Barnaby, H.J., Patadia, A., Holbert, K., Privat, A.
Published in Microelectronics and reliability (01.01.2020)
Published in Microelectronics and reliability (01.01.2020)
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Journal Article