A Characterization Method for TID Versus Temperature Effects on Microelectronic Circuits
Rizzo, Marta, Muschitiello, Michele, Gupta, Viyas, Poizat, Marc
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
Total Ionizing Dose Effects in 3-D NAND Flash Memories
Bagatin, Marta, Gerardin, Simone, Paccagnella, Alessandro, Beltrami, Silvia, Costantino, Alessandra, Muschitiello, Michele, Zadeh, Ali, Ferlet-Cavrois, Veronique
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
PIPS Diode Test Setup for Heavy Ion Beam Spectral Characterization
Borel, Thomas, Costantino, Alessandra, Muschitiello, Michele, Kettunen, Heikki, Standaert, Laurent, Santin, Giovanni, Pinto, Marco, Rizzo, Marta, Pesce, Anastasia, Ferlet-Cavrois, Veronique
Published in IEEE transactions on nuclear science (01.08.2023)
Published in IEEE transactions on nuclear science (01.08.2023)
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Journal Article
Heavy-Ion-Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence
Javanainen, Arto, Turowski, Marek, Galloway, Kenneth F., Nicklaw, Christopher, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Lauenstein, Jean-Marie, Muschitiello, Michele, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, A.
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
Sample-to-Sample Variability and Bit Errors Induced by Total Dose in Advanced NAND Flash Memories
Bagatin, Marta, Gerardin, Simone, Ferrarese, Federica, Paccagnella, Alessandro, Ferlet-Cavrois, Veronique, Costantino, Alessandra, Muschitiello, Michele, Visconti, Angelo, Wang, Pierre-Xiao
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers
Kupsc, Pawel, Javanainen, Arto, Ferlet-Cavrois, Veronique, Muschitiello, Michele, Barnes, Andrew, Zadeh, Ali, Calcutt, Jordan, Poivey, Christian, Stieglauer, Hermann, Voss, Kay-Obbe
Published in IEEE transactions on nuclear science (01.02.2018)
Published in IEEE transactions on nuclear science (01.02.2018)
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Journal Article
Sub-LET Threshold SEE Cross Section Dependency With Ion Energy
Alia, Ruben Garcia, Bahamonde, Cristina, Brandenburg, Sytze, Brugger, Markus, Daly, Eamonn, Ferlet-Cavrois, Veronique, Gaillard, Remi, Hoeffgen, Stefan, Menicucci, Alessandra, Metzger, Stefan, Zadeh, Ali, Muschitiello, Michele, Noordeh, Emil, Santin, Giovanni
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Proton Dominance of Sub-LET Threshold GCR SEE Rate
Alia, Ruben Garcia, Brugger, Markus, Ferlet-Cavrois, Veronique, Brandenburg, Sytze, Calcutt, Jordan, Cerutti, Francesco, Daly, Eamonn, Ferrari, Alfredo, Muschitiello, Michele, Santin, Giovanni, Uznanski, Slawosz, Van Goethem, Marc-Jan, Zadeh, Ali
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Closed-Loop Compensation of Dielectric Charge Induced by Ionizing Radiation
Dominguez-Pumar, Manuel, Gorreta, Sergi, Pons-Nin, Joan, Gomez-Rodriguez, Faustino, Gonzalez-Castano, Diego M., Muschitiello, Michele
Published in Journal of microelectromechanical systems (01.06.2015)
Published in Journal of microelectromechanical systems (01.06.2015)
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Journal Article
Publication
Application of a Focused, Pulsed X-Ray Beam to the Investigation of Single-Event Transients in Al0.3Ga0.7N/GaN HEMTs
Khachatrian, A., Roche, N. J-H, Buchner, S. P., Koehler, A. D., Anderson, T. J., Hobart, K. D., McMorrow, D., LaLumondiere, S. D., Wells, N. P., Bonsall, J., Dillingham, E. C., Karuza, P., Brewe, D. L., Lotshaw, W. T., Moss, S. C., Ferlet-Cavrois, V., Muschitiello, M.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Semi-Empirical Model for SEGR Prediction
Javanainen, Arto, Ferlet-Cavrois, Veronique, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
SEGR in SiO[Formula Omitted]-Si[Formula Omitted]N[Formula Omitted] Stacks
Javanainen, Arto, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R, Shaneyfelt, Marty R, Virtanen, Ari
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Influence of Beam Conditions and Energy for SEE Testing
Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santin, Giovanni, Nickson, Bob, Menicucci, Alessandra, Binois, Christian, Peyre, Daniel, Hoeffgen, Stefan Klaus, Metzger, Stefan, Schardt, Dieter, Kettunen, Heikki, Virtanen, Ari, Berger, Guy, Piquet, Bruno, Foy, Jean-Claude, Zafrani, Max, Truscott, Pete, Poizat, Marc, Bezerra, Francoise
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
SEGR in SiO 2 -Si 3 N 4 Stacks
Javanainen, Arto, Ferlet-Cavrois, Véronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Effects of Ion Species on SEB Failure Voltage of Power DMOSFET
Liu, S., Lauenstein, Jean-Marie, Ferlet-Cavrois, V., Marec, R., Hernandez, F., Scheick, L., Bezerra, F., Muschitiello, M., Poivey, C., Sukhaseum, N., Coquelet, L., Cao, H., Carrier, D., Brisebois, M. A., Mangeret, R., Ecoffet, R., LaBel, K., Zafrani, M., Sherman, P.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs
Liu, Sandra, Marec, Ronan, Sherman, Phillip, Titus, Jeffrey L., Bezerra, Francoise, Ferlet-Cavois, Véronique, Marin, Marc, Sukhaseum, Nicolas, Widmer, Fabien, Muschitiello, Michele, Gouyet, Lionel, Ecoffet, Robert, Zafrani, Max
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs-Methodology for Radiation Hardness Assurance
Ferlet-Cavrois, V., Binois, C., Carvalho, A., Ikeda, N., Inoue, M., Eisener, B., Gamerith, S., Chaumont, G., Pintacuda, F., Javanainen, A., Schwank, J. R., Shaneyfelt, M. R., Lauenstein, J-M, Ladbury, R. L., Muschitiello, M., Poivey, C., Mohammadzadeh, A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Prototyping and characterization of radiation hardened SiC MOS structures
Pintacuda, Francesco, Cantarella, Vincenzo, Muschitiello, Michele, Massetti, Silvia
Published in 2019 European Space Power Conference (ESPC) (01.09.2019)
Published in 2019 European Space Power Conference (ESPC) (01.09.2019)
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Conference Proceeding
Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases
Martin-Holgado, Pedro, Romero-Maestre, Amor, de-Martin-Hernandez, Jose, Krimmel, Florian, Borel, Thomas, Muschitiello, Michele, Costantino, Alessandra, Tonicello, Ferdinando, Poivey, Christian, Pesce, Anastasia, Ramos, Olga, Dominguez, Manuel, Morilla, Yolanda
Published in 2023 IEEE Space Computing Conference (SCC) (01.07.2023)
Published in 2023 IEEE Space Computing Conference (SCC) (01.07.2023)
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Conference Proceeding