A Preliminary Study about SEU Effects on Programmable Interconnections of SRAM-based FPGAs
Alderighi, M., Casini, F., D’Angelo, S., Gravina, A., Liberali, V., Mancini, M., Musazzi, P., Pastore, S., Sassi, M., Sorrenti, G.
Published in Journal of electronic testing (01.06.2013)
Published in Journal of electronic testing (01.06.2013)
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