High-space resolution imaging plate analysis of extreme ultraviolet (EUV) light from tin laser-produced plasmas
Musgrave, Christopher S. A., Murakami, Takehiro, Ugomori, Teruyuki, Yoshida, Kensuke, Fujioka, Shinsuke, Nishimura, Hiroaki, Atarashi, Hironori, Iyoda, Tomokazu, Nagai, Keiji
Published in Review of scientific instruments (01.03.2017)
Published in Review of scientific instruments (01.03.2017)
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SAMPLE MEASUREMENT METHOD USING CHARGED PARTICLE BEAM SYSTEM AND SCANNING ELECTRON MICROSCOPE
ABE SEI, NEMOTO YOSHIKAZU, MURAKAMI TAKEHIRO, MAEDA TAKAKUNI, KAWAMOTO MASATSUGU, MEZAKI HIROKI
Year of Publication 20.08.2020
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Year of Publication 20.08.2020
Patent