Grain Boundary Carrier Scattering in ZnO Thin Films: a Study by Temperature-Dependent Charge Carrier Transport Measurements
Muniswami Naidu, R.V., Subrahmanyam, Aryasomayajula, Verger, Arnaud, Jain, M.K., Bhaskara Rao, S.V.N., Jha, S.N., Phase, D.M.
Published in Journal of electronic materials (01.04.2012)
Published in Journal of electronic materials (01.04.2012)
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