Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers
Diercks, David R., Gorman, Brian P., Mulders, Johannes J. L.
Published in Microscopy and microanalysis (01.04.2017)
Published in Microscopy and microanalysis (01.04.2017)
Get full text
Journal Article
Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality
Prokhodtseva, Anna, Mulders, Johannes, Vystavel, Tomas
Published in Microscopy and microanalysis (01.07.2017)
Published in Microscopy and microanalysis (01.07.2017)
Get full text
Journal Article
A Static Low Energy Ion Source for Local Surface Modification
Mulders, Johannes J L, Trompenaars, Petrus HF
Published in Microscopy and microanalysis (01.07.2016)
Published in Microscopy and microanalysis (01.07.2016)
Get full text
Journal Article
Gas-assisted electron-beam-induced nanopatterning of high-quality Si-based insulator
Riazanova, A V, Costanzi, B N, Aristov, A, Rikers, Y G M, Ström, V, Mulders, J J L, Kabashin, A V, Dahlberg, E Dan, Belova, L M
Published in Nanotechnology (18.04.2014)
Published in Nanotechnology (18.04.2014)
Get full text
Journal Article