Search Results - "Muhmann, C." :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers

Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers

by Heile, A., Muhmann, C., Lipinsky, D., Arlinghaus, H.F.
Published in Applied surface science (01.07.2012)

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Journal Article

Investigations of secondary ion yield-enhancing methods in combination

Investigations of secondary ion yield-enhancing methods in combination

by Heile, A., Muhmann, C., Lipinsky, D., Arlinghaus, H. F.
Published in Surface and interface analysis (01.01.2011)

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Journal Article Conference Proceeding