Revisiting MOSFET threshold voltage extraction methods
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Terán Barrios, Alberto, Liou, Juin J., Ho, Ching-Sung
Published in Microelectronics and reliability (01.01.2013)
Published in Microelectronics and reliability (01.01.2013)
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Journal Article
A Review of Core Compact Models for Undoped Double-Gate SOI MOSFETs
Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J., Muci, Juan, Malobabic, Slavica, Liou, Juin J.
Published in IEEE transactions on electron devices (01.01.2007)
Published in IEEE transactions on electron devices (01.01.2007)
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Journal Article
Rigorous analytic solution for the drain current of undoped symmetric dual-gate MOSFETs
Ortiz-Conde, Adelmo, García Sánchez, Francisco J., Muci, Juan
Published in Solid-state electronics (01.04.2005)
Published in Solid-state electronics (01.04.2005)
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Journal Article
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Rey, Álvaro D., Ho, Ching-Sung, Liou, Juin J.
Published in Microelectronics and reliability (01.07.2009)
Published in Microelectronics and reliability (01.07.2009)
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Journal Article
A DC Method to Extract Mobility Degradation and Series Resistance of Multifinger Microwave MOSFETs
Sucre-Gonzalez, Andrea, Zarate-Rincon, Fabian, Ortiz-Conde, Adelmo, Torres-Torres, Reydezel, Garcia-Sanchez, Francisco J., Muci, Juan, Murphy-Arteaga, Roberto S.
Published in IEEE transactions on electron devices (01.05.2016)
Published in IEEE transactions on electron devices (01.05.2016)
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Journal Article
Modeling of Thin-Film Lateral SOI PIN Diodes with an Alternative Multi-Branch Explicit Current Model
Lugo-Muñoz, Denise, Muci, Juan, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., De Souza, Michelly, Flandre, Denis, Pavanello, Marcelo Antonio
Published in Journal of Integrated Circuits and Systems (27.12.2020)
Published in Journal of Integrated Circuits and Systems (27.12.2020)
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Journal Article
Threshold voltage extraction in Tunnel FETs
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Sucre-González, Andrea, Martino, João Antonio, Agopian, Paula Ghedini Der, Claeys, Cor
Published in Solid-state electronics (01.03.2014)
Published in Solid-state electronics (01.03.2014)
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Journal Article
Lumped Parameter Modeling of Organic Solar Cells' S-Shaped I-V Characteristics
García-Sánchez, F. J., Lugo-Muñoz, D., Muci, J., Ortiz-Conde, A.
Published in IEEE journal of photovoltaics (01.01.2013)
Published in IEEE journal of photovoltaics (01.01.2013)
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Journal Article
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances
Lugo-Muñoz, Denise, Muci, Juan, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Souza, Michelly de, Pavanello, Marcelo A.
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
Approximate analytical expression for the tersminal voltage in multi-exponential diode models
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Terán Barrios, Alberto, Muci, Juan, de Souza, Michelly, Pavanello, Marcelo A.
Published in Solid-state electronics (01.11.2013)
Published in Solid-state electronics (01.11.2013)
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Journal Article
Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting
Lugo-Muñoz, Denise, De Souza, Michelly, Pavanello, Marcelo A., Flandre, Denis, Muci, Juan, Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J.
Published in ECS transactions (01.01.2010)
Published in ECS transactions (01.01.2010)
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Journal Article
Transformation Between Power-law and Polynomial Thin-Film Transistor Models
Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J., Muci, Juan
Published in ECS transactions (04.09.2009)
Published in ECS transactions (04.09.2009)
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Journal Article
A new integration-based procedure to separately extract series resistance and mobility degradation in MOSFETs
Muci, Juan, Muñoz, Denise C Lugo, Rey, Álvaro D Latorre, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J, Ho, Ching-Sung, Liou, Juin J
Published in Semiconductor science and technology (01.10.2009)
Published in Semiconductor science and technology (01.10.2009)
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Journal Article
Characterization of Thin-Film SOI PIN Diodes from Cryogenic to Above Room Temperatures Using an Explicit I-V Multi-Branch Model
Lugo-Muñoz, Denise, Muci, Juan, Ortiz-Conde, Adelmo, García-Sanchez, Francisco, De Souza, Michelly, Flandre, Denis, Pavanello, Marcelo A.
Published in ECS transactions (01.01.2011)
Published in ECS transactions (01.01.2011)
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Journal Article