by Latry, O., Dherbécourt, P., Mourgues, K., Maanane, H., Sipma, J.P., Cornu, F., Eudeline, P., Masmoudi, M.
Published in Microelectronics and reliability (01.09.2010)

by Lachéze, L., Latry, O., Dherbécourt, P., Mourgues, K., Purohit, V., Maanane, H., Sipma, J.P., Cornu, F., Eudeline, P.
Published in Microelectronics and reliability (01.08.2011)

by Gares, M., Maanane, H., Masmoudi, M., Bertram, P., Marcon, J., Belaid, M.A., Mourgues, K., Tolant, C., Eudeline, P.
Published in Microelectronics and reliability (01.09.2006)

by Gares, M., Belaïd, M.A., Maanane, H., Masmoudi, M., Marcon, J., Mourgues, K., Eudeline, Ph
Published in Microelectronics and reliability (01.09.2007)

by Helen, Y., Dassow, R., Nerding, M., Mourgues, K., Raoult, F., Köhler, J.R., Mohammed-Brahim, T., Rogel, R., Bonnaud, O., Werner, J.H., Strunk, H.P.
Published in Thin solid films (15.02.2001)

by Belaïd, M.A., Ketata, K., Mourgues, K., Maanane, H., Masmoudi, M., Marcon, J.
Published in Microelectronics and reliability (01.09.2005)

by Maanane, H., Masmoudi, M., Marcon, J., Belaid, M.A., Mourgues, K., Tolant, C., Ketata, K., Eudeline, Ph
Published in Microelectronics and reliability (01.05.2006)

by Mercha, A., Pichon, L., Carin, R., Mourgues, K., Bonnaud, O.
Published in Thin solid films (01.02.2001)

by Belaïd, M.A., Ketata, K., Gares, M., Mourgues, K., Masmoudi, M., Marcon, J.
Published in Microelectronics and reliability (2007)

by MAANANE, H, BERTRAM, P, MARCON, J, MASMOUDI, M, BELAID, M, MOURGUES, K, EUDELINE, P, KETATA, K
Published in Microelectronics and reliability (01.09.2004)

by Helen, Y, Mourgues, K, Raoult, F, Mohammed-Brahim, T, Bonnaud, O, Rogel, R, Prochasson, S, Boher, P, Zahorski, D
Published in Thin solid films (11.01.1999)

by Mourgues, K, Rahal, A, Mohammed-Brahim, T, Sarret, M, Kleider, J.P, Longeaud, C, Bachrouri, A, Romano-Rodriguez, A
Published in Journal of non-crystalline solids (01.05.2000)

by Pichon, L, Mourgues, K, Raoult, F, Mohammed-Brahim, T, Kis-Sion, K, Briand, D, Bonnaud, O
Published in Semiconductor science and technology (01.11.2001)

by Dassow, R, Köhler, J R, Helen, Y, Mourgues, K, Bonnaud, O, Mohammed-Brahim, T, Werner, J H
Published in Semiconductor science and technology (01.10.2000)

by Tala-Ighil, B., Rahal, A., Mourgues, K., Toutah, A., Pichon, L., Mohammed-Brahim, T., Raoult, F., Bonnaud, O.
Published in Thin solid films (01.01.1999)

by Pichon, L., Raoult, F., Mourgues, K., Kis-Sion, K., Mohammed-Brahim, T., Bonnaud, O.
Published in Thin solid films (01.03.1997)

by Toutah, H., Tala-Ighil, B., Llibre, J.F., Rahal, A., Mourgues, K., Helen, Y., Mohammed-Brahim, T., Dassow, R., Köhler, J.R.
Published in Thin solid films (15.02.2001)

by Toutah, H., Llibre, J.F., Tala-Ighil, B., Mohammed-Brahim, T., Mourgues, K., Helen, Y., Raoult, F., Bonnaud, O.
Published in Microelectronics and reliability (01.08.2000)

by Belaïd, M.A., Ketata, K., Mourgues, K., Gares, M., Masmoudi, M., Marcon, J.
Published in Microelectronics (01.02.2007)

by Tala-Ighil, B., Toutah, H., Rahal, A., Mourgues, K., Pichon, L., Raoult, F., Bonnaud, O., Mohammed-Brahim, T.
Published in Microelectronics and reliability (01.06.1998)