Impact of oxide thickness on SEGR failure in vertical power MOSFETs; development of a semi-empirical expression
Titus, J.L., Wheatley, C.F., Burton, D.I., Mouret, I., Allenspach, M., Brews, J., Schrimpf, R., Galloway, K., Pease, R.L.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Evaluation of SEGR threshold in power MOSFETs
Allenspach, M., Brews, J.R., Mouret, I., Schrimpf, R.D., Galloway, K.F.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Journal Article
Conference Proceeding
Single-event gate-rupture in power MOSFETs: prediction of breakdown biases and evaluation of oxide thickness dependence
Allenspach, M., Mouret, I., Titus, J.L., Wheatley, C.F., Pease, R.L., Brews, J.R., Schrimpf, R.D., Galloway, K.F.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Why does the single neuron activity change from trial to trial during sensory-motor task?
Akamatsu, M, Terao, A, Hasbroucq, T, Mouret, I, Seal, J
Published in Methods of information in medicine (01.12.1997)
Published in Methods of information in medicine (01.12.1997)
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Journal Article
Measurement of a cross-section for single-event gate rupture in power MOSFETs
Mouret, I., Calvel, P., Allenspach, M., Titus, J.L., Wheatley, C.F., LaBel, K.A., Calvet, M.-C., Schrimpf, R.D., Galloway, K.F.
Published in IEEE electron device letters (01.04.1996)
Published in IEEE electron device letters (01.04.1996)
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Journal Article
Temperature and angular dependence of substrate response in SEGR [power MOSFET]
Mouret, I., Allenspach, M., Schrimpf, R.D., Brews, J.R., Galloway, K.F., Calvel, P.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1994)
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Journal Article
Conference Proceeding
Identification of an axonal determinant in the C-terminus of the sodium channel Na(v)1.2
Garrido, J J, Fernandes, F, Giraud, P, Mouret, I, Pasqualini, E, Fache, M P, Jullien, F, Dargent, B
Published in The EMBO journal (01.11.2001)
Published in The EMBO journal (01.11.2001)
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Journal Article
Finger Pairings in Two-Choice Reaction Time Taskscolon: Does the Between-Hands Advantage Reflect Response Preparation?
Hasbroucq, T., Mouret, I., Seal, J., Akamatsu, M.
Published in Journal of motor behavior (01.09.1995)
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Published in Journal of motor behavior (01.09.1995)
Journal Article
Cortico-spinal inhibition reflects time but not event preparation: neural mechanisms of preparation dissociated by transcranial magnetic stimulation
Hasbroucq, Thierry, Osman, Allen, Possamaı̈, Camille-Aimé, Burle, Borı́s, Carron, Stéphane, Dépy, Delphine, Latour, Sébastien, Mouret, Isabelle
Published in Acta psychologica (01.04.1999)
Published in Acta psychologica (01.04.1999)
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Journal Article
Identification of an axonal determinant in the C-terminus of the sodium channel Na sub(v)1.2
Garrido, J J, Fernandes, F, Giraud, P, Mouret, I, Pasqualini, E, Fache, M, Jullien, F, Dargent, B
Published in The EMBO journal (01.11.2001)
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Published in The EMBO journal (01.11.2001)
Journal Article
Cortico-spinal inhibition reflects time but not event preparation : neural mechanisms of preparation dissociated by transcranial magnetic stimulation: Varieties of inhibitory control: neural bases and behavioral manifestations
HASBROUCQ, T, OSMAN, A, POSSAMAÏ, C.-A, BURLE, B, CARRON, S, DEPY, D, LATOUR, S, MOURET, I
Published in Acta psychologica (1999)
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Published in Acta psychologica (1999)
Journal Article
Temperature and angular dependence of substrate response in SEGR power MOSFET
Mouret, I, Allenspach, M, Schrimpf, R D, Brews, J R, Galloway, K F, Calvel, P
Published in IEEE transactions on nuclear science (01.12.1994)
Published in IEEE transactions on nuclear science (01.12.1994)
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Journal Article
Experimental evidence of the temperature and angular dependence inSEGR power MOSFET
Mouret, I, Calvet, M-C, Calvel, P, Tastet, P, Allenspach, M, LaBel, K A, Titus, J L, Wheatley, C F, Schrimpf, R D, Galloway, K F
Published in IEEE transactions on nuclear science (01.06.1996)
Published in IEEE transactions on nuclear science (01.06.1996)
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Journal Article
Experimental evidence of the temperature and angular dependence in SEGR [power MOSFET]
Mouret, I., Calvet, M.-C., Calvel, P., Tastet, P., Allenspach, M., LaBel, K.A., Titus, J.L., Wheatley, C.F., Schrimpf, R.D., Galloway, K.F.
Published in IEEE transactions on nuclear science (01.06.1996)
Published in IEEE transactions on nuclear science (01.06.1996)
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Journal Article
Experimental evidence of the temperature and angular dependence in SEGR [power MOSFETs]
Mouret, I., Calvet, M.-C., Calvel, P., Tastet, P., Allenspach, M., LaBel, K.A., Titus, J.L., Wheatley, C.F., Schrimpf, R.D., Galloway, K.F.
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
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Conference Proceeding