Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
Deshayes, Y., Bord, I., Barreau, G., Aiche, M., Moretto, P.H., Béchou, L., Roehrig, A.C., Ousten, Y.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
Get full text
Journal Article
Conference Proceeding