Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies
Bossuet, A., Divay, A., Martineau, B., Dehos, C., Blampey, B., Morandini, Y.
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
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Conference Proceeding
Engineering SOI Substrates for RF to mmWave Front-Ends
Allibert, F, Andia, L, Morandini, Y, Veytizou, C, Rack, M, Nyssens, L, Raskin, J P, Augendre, E
Published in Microwave Journal (01.10.2020)
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Published in Microwave Journal (01.10.2020)
Trade Publication Article
CMOS FD-SOI Technologies Ruggedness for Millimeter Wave Power Amplifier Design
Martineau, B., Bossuet, A., Divay, A., Blampey, B., Morandini, Y.
Published in 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (24.10.2022)
Published in 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (24.10.2022)
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Conference Proceeding
Optical high frequency test structure and test bench definition for on wafer silicon integrated noise source characterization up to 110 GHz based on Germanium-on-Silicon photodiode
Oeuvrard, S., Lampin, J., Ducournau, G., Virot, L., Fedeli, J. M., Hartmann, J. M., Danneville, F., Morandini, Y., Gloria, D.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Characterization and Model Parameter Extraction of Symmetrical Centre Tapped Inductor using Build in Mixed Mode and Pure Differential S-Parameters
Gianesello, F., Morandini, Y., Boret, S., Gloria, D.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
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Conference Proceeding
In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization
Tagro, Y., Gloria, D., Boret, S., Morandini, Y., Dambrine, G.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
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Conference Proceeding
Silicon high frequency test structures improvement for millimeter wave varactors characterization optimization and modeling
Sonnerat, F., Debroucke, R., Morandini, Y., Gloria, D., Arnould, J., Gaquiere, C.
Published in 2011 IEEE ICMTS International Conference on Microelectronic Test Structures (01.04.2011)
Published in 2011 IEEE ICMTS International Conference on Microelectronic Test Structures (01.04.2011)
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Conference Proceeding
Differential P+/Nwell varactor High Frequency Characterization
Morandini, Y., Rapisarda, D., Larchanche, J.-F., Gaquiere, C.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
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Conference Proceeding
In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60-110GHz
Tagro, Y., Gloria, D., Boret, S., Morandini, Y., Dambrine, G.
Published in 2008 72nd ARFTG Microwave Measurement Symposium (01.12.2008)
Published in 2008 72nd ARFTG Microwave Measurement Symposium (01.12.2008)
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Conference Proceeding
Evaluation of sub-32nm CMOS technology for Millimeter wave applications
Morandini, Y, Gianesello, F, Boret, S, Lasserre, S, Gloria, D, Pekarik, J
Published in The 40th European Microwave Conference (01.09.2010)
Published in The 40th European Microwave Conference (01.09.2010)
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Conference Proceeding
Multiport de-embedding technique for balanced varactor high frequency characterization
Morandini, Y., Debroucke, R., Larchanche, J. F., Jan, S., Boret, S., Gloria, D., Pekarik, J.
Published in 2009 European Microwave Conference (EuMC) (01.09.2009)
Published in 2009 European Microwave Conference (EuMC) (01.09.2009)
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Conference Proceeding