by Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.
Published in Microelectronics and reliability (01.03.2005)

by Goguenheim, D, Bravaix, A, Monserie, C, Moragues, J.M, Lambert, P, Boivin, P
Published in Solid-state electronics (01.08.2001)

by Goguenheim, D, Bravaix, A, Moragues, J.M, Lambert, P, Boivin, P
Published in Microelectronics and reliability (01.04.2000)

by Moragues, J.-M., Sagnes, B., Yckache, K., Jérisian, R., Oualid, J., Vuillaume, D.
Published in Microelectronic engineering (01.06.1995)

by MORAGUES, J. M, SAGNES, B, JERISIAN, R, OUALID, J, CIANTAR, E, LIOTARD, J. L, MERENDA, P
Published in Journal of non-crystalline solids (01.07.1995)

by Firiti, A., Faujour, D., Haller, G., Moragues, J.M., Goubier, V., Perdu, P., Beaudoin, F., Lewis, D.
Published in Microelectronics and reliability (01.09.2003)

by Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Fornara, Pascal, Escales, Jean-Philippe, Potard, Pascale, Moragues, Jean-Michel, Ogier, Jean-Luc
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)

by Ciantar, Eric, Boivin, Philippe, Burle, Michel, Niel, Christophe, Michel Moragues, J., Sagnes, Bruno, Jerisian, Robert, Oualid, Jean
Published in Journal of non-crystalline solids (01.07.1995)

by Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.
Published in 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) (2004)

by Moragues, J.-M., Bouzidi, J., Ciantar, E., Jerisian, R., Oualid, J., Cristoloveanu, S.
Published in Microelectronics (01.06.1994)

by Moragues, J-M, Bouzidi, J, Ciantar, E, Jerisian, R, Oualid, J, Cristoloveanu, S
Published in Microelectronics (01.01.1994)

by Odiot, F., Brut, H., Hurwitz, J., Grant, L., Dunne, B., Moragues, J.M.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)