Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies
Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.
Published in Microelectronics and reliability (01.03.2005)
Published in Microelectronics and reliability (01.03.2005)
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Journal Article
Comparison of oxide leakage currents induced by ion implantation and high field electric stress
Goguenheim, D, Bravaix, A, Monserie, C, Moragues, J.M, Lambert, P, Boivin, P
Published in Solid-state electronics (01.08.2001)
Published in Solid-state electronics (01.08.2001)
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Journal Article
Comparison of oxide leakage currents induced by ion implantation and high field electric stress
Goguenheim, D, Bravaix, A, Moragues, J.M, Lambert, P, Boivin, P
Published in Microelectronics and reliability (01.04.2000)
Published in Microelectronics and reliability (01.04.2000)
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Journal Article
Influence of WSi2 polysilicide gate process on integrity and reliability of gate and tunnel oxides
MORAGUES, J. M, SAGNES, B, JERISIAN, R, OUALID, J, CIANTAR, E, LIOTARD, J. L, MERENDA, P
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Conference Proceeding
Journal Article
Short defect characterization based on TCR parameter extraction
Firiti, A., Faujour, D., Haller, G., Moragues, J.M., Goubier, V., Perdu, P., Beaudoin, F., Lewis, D.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Pelissier, Bernard, Fornara, Pascal, Escales, Jean-Philippe, Potard, Pascale, Moragues, Jean-Michel, Ogier, Jean-Luc
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
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Conference Proceeding
Influence of FN electron injections in dry and dry/wet/dry gate oxides: Relation with failure
Ciantar, Eric, Boivin, Philippe, Burle, Michel, Niel, Christophe, Michel Moragues, J., Sagnes, Bruno, Jerisian, Robert, Oualid, Jean
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Journal Article
Conference Proceeding
Improved methodology based on hot carriers injections to detect wafer charging damage in advanced CMOS technologies
Goguenheim, D., Bravaix, A., Gomri, S., Moragues, J.M., Monserie, C., Legrand, N., Boivin, P.
Published in 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) (2004)
Published in 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) (2004)
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Conference Proceeding
Coupling between the front and back interfaces in the gate-controlled P+PN+ diode on silicon-on-insulator
Moragues, J.-M., Bouzidi, J., Ciantar, E., Jerisian, R., Oualid, J., Cristoloveanu, S.
Published in Microelectronics (01.06.1994)
Published in Microelectronics (01.06.1994)
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Journal Article
New test structure for high resolution leakage current and capacitance measurements in CMOS imager applications
Odiot, F., Brut, H., Hurwitz, J., Grant, L., Dunne, B., Moragues, J.M.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)
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Conference Proceeding