by Tokei, Zs, Ciofi, I., Roussel, Ph, Debacker, P., Raghavan, P., van der Veen, M. H., Jourdan, N., Wilson, C. J., Gonzalez, V. V., Adelmann, C., Wen, L., Croes, K., Moors, O. Varela Pedreira K., Krishtab, M., Armini, S., Bommels, J.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)