An Innovative Indicator to Evaluate DRAM Cell Transistor Leakage Current Distribution
Cho, Min Hee, Jeon, Namho, Kim, Taek Yong, Jeong, Moonyoung, Lee, Sungsam, Hong, Jong Seo, Hong, Hyeong Sun, Yamada, Satoru
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
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Journal Article
A novel method to characterize DRAM process variation by the analyzing stochastic properties of retention time distribution
Min Hee Cho, Namho Jeon, Moonyoung Jeong, Sungsam Lee, Yamada, Satoru, Hyeongsun Hong
Published in 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) (01.02.2017)
Published in 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) (01.02.2017)
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Conference Proceeding
Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor
Jeong, Moonyoung, Lee, Sangho, Jun, Yootak, Lee, Kiseok, Park, Seokhan, Oh, Jeonghoon, Kim, Ilgweon, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
In-Depth Analysis of NBTI at 2X nm Node DRAM
Seunguk Han, Sungsam Lee, Sungkweon Baek, Sungho Jang, Wonchang Jeong, Kijae Huh, Moonyoung Jeong, Junhee Lim, Yamada, Satoru, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
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Conference Proceeding
Cell to Core-Periphery Overlap (C2O) Based on BCAT for Next Generation DRAM
Lee, Kiseok, Lee, Hongjun, Choi, Hyungeun, Kim, Jeongsu, Kim, Kyunghwan, Jeong, Moonyoung, Bae, Soohyun, Kim, Hyebin, Lee, Jiyun, Kim, Minsoo, Kim, Keunnam, Kim, Huijung, Park, Sungmin, Park, Taejin, Han, Jin-woo, Oh, Jeonghoon, Kim, Yong Kwan, Yim, Sungsoo, Kim, Bongsoo, Park, Jemin, Song, Jaihyuk
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Medical Procedure-Related Transient Global Amnesia
Jeong, Moonyoung, Kim, Won Sik, Kim, Ah-Ran, Park, Jeong Jin, Choi, Dong-Hee, Kim, Hahn Young
Published in European neurology (01.01.2018)
Published in European neurology (01.01.2018)
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Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO 2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
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Journal Article
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Shin, Hyunseo, Yoo, Bowon, Lee, Kiseok, Jeong, Moonyoung, Park, Seokhan
Year of Publication 26.10.2023
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Year of Publication 26.10.2023
Patent
SEMICONDUCTOR DEVICE
NOH, Hyungjun, LEE, Sangho, JEONG, Moonyoung, LEE, Kiseok, CHOI, Hyungeun
Year of Publication 05.10.2023
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Year of Publication 05.10.2023
Patent
SEMICONDUCTOR DEVICE
KIM, JUNSOO, JANG, SUNGHO, HAN, JOON, KIM, ILGWEON, JEONG, MOONYOUNG, WOO, DONGSOO
Year of Publication 18.07.2024
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Year of Publication 18.07.2024
Patent
Self-Aligned in 2Pitch Cell Array Transistor (S2CAT) for 4F2 Based DRAM Generation Extension
Park, Seokhan, Oh, Gyuhwan, Yoo, Bowon, Jeong, Moonyoung, Lee, Kiseok, Lee, Sangho, Hong, Seongbin, Sung, Sang Hyun, Choi, Hyungeun, Jo, Taegeun, Jang, Wonchul, Park, Jaekyun, Park, Sangwuk, Yun, Hyunchul, Kim, Jinbum, Jang, Sunghwan, Kuh, Bong-Jin, Kim, Ilgweon, Oh, Jeonghoon, Han, Jin-Woo, Park, Jemin
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding