Channel Hot Carrier Degradation Mechanism in Long/Short Channel n-FinFETs
Moonju Cho, Roussel, Philippe, Kaczer, Ben, Degraeve, Robin, Franco, Jacopo, Aoulaiche, Marc, Chiarella, Thomas, Kauerauf, Thomas, Horiguchi, Naoto, Groeseneken, Guido
Published in IEEE transactions on electron devices (01.12.2013)
Published in IEEE transactions on electron devices (01.12.2013)
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Journal Article
SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices-Part I: NBTI
Franco, J., Kaczer, B., Roussel, P. J., Mitard, J., Moonju Cho, Witters, L., Grasser, T., Groeseneken, G.
Published in IEEE transactions on electron devices (01.01.2013)
Published in IEEE transactions on electron devices (01.01.2013)
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Journal Article
Insight Into N/PBTI Mechanisms in Sub-1-nm-EOT Devices
Moonju Cho, Jae-Duk Lee, Aoulaiche, M., Kaczer, B., Roussel, P., Kauerauf, T., Degraeve, R., Franco, J., Ragnarsson, L., Groeseneken, G.
Published in IEEE transactions on electron devices (01.08.2012)
Published in IEEE transactions on electron devices (01.08.2012)
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Journal Article
Digital therapeutics using virtual reality‐based visual perceptual learning for visual field defects in stroke: A double‐blind randomized trial
Namgung, Eun, Kwon, Sun U., Han, Moon‐Ku, Kim, Gyeong‐Moon, Kim, Hahn Young, Park, Kwang‐Yeol, Cho, Moonju, Choi, Ha‐Gyun, Nah, Hyun‐Wook, Lim, Hyun Taek, Kang, Dong‐Wha
Published in Brain and behavior (01.05.2024)
Published in Brain and behavior (01.05.2024)
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Journal Article
Diffusion and Gate Replacement: A New Gate-First High- k /Metal Gate CMOS Integration Scheme Suppressing Gate Height Asymmetry
Ritzenthaler, Romain, Schram, Tom, Spessot, Alessio, Caillat, Christian, Moonju Cho, Simoen, Eddy, Aoulaiche, Marc, Albert, Johan, Soon-Aik Chew, Noh, Kyoung Bong, Yunik Son, Mitard, Jerome, Mocuta, Anda, Horiguchi, Naoto, Fazan, Pierre, Thean, Aaron Voon-Yew
Published in IEEE transactions on electron devices (01.01.2016)
Published in IEEE transactions on electron devices (01.01.2016)
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Journal Article
Endurance of One Transistor Floating Body RAM on UTBOX SOI
Aoulaiche, Marc, Bravaix, Alain, Simoen, Eddy, Caillat, Christian, Moonju Cho, Witters, Liesbeth, Blomme, Pieter, Fazan, Pierre, Groeseneken, Guido, Jurczak, Malgorzata
Published in IEEE transactions on electron devices (01.03.2014)
Published in IEEE transactions on electron devices (01.03.2014)
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Journal Article
Negative Bias Temperature Instability in p-FinFETs With 45 ^ Substrate Rotation
Moonju Cho, Ritzenthaler, Romain, Krom, Raymond, Higuchi, Yuichi, Kaczer, Ben, Chiarella, Thomas, Boccardi, Guillaume, Togo, Mitsuhiro, Horiguchi, Naoto, Kauerauf, Thomas, Groeseneken, Guido
Published in IEEE electron device letters (01.10.2013)
Published in IEEE electron device letters (01.10.2013)
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Journal Article
Impact of Off State Stress on advanced high-K metal gate NMOSFETs
Spessot, Alessio, Aoulaiche, Marc, Moonju Cho, Franco, Jacopo, Schram, Tom, Ritzenthaler, Romain, Kaczer, Ben
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Study of the Reliability Impact of Chlorine Precursor Residues in Thin Atomic-Layer-Deposited HfO2 Layers
Moonju Cho, Moonju Cho, Degraeve, R, Pourtois, G, Delabie, A, Ragnarsson, L.-A, Kauerauf, T, Groeseneken, G, De Gendt, S, Heyns, M, Cheol Seong Hwang, Cheol Seong Hwang
Published in IEEE transactions on electron devices (01.04.2007)
Published in IEEE transactions on electron devices (01.04.2007)
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Journal Article
Process-Dependent N/PBTI Characteristics of TiN Gate FinFETs
Jin Ju Kim, Moonju Cho, Pantisano, L., Ukjin Jung, Young Gon Lee, Chiarella, T., Togo, M., Horiguchi, N., Groeseneken, G., Byoung Hun Lee
Published in IEEE electron device letters (01.07.2012)
Published in IEEE electron device letters (01.07.2012)
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Journal Article
Off-state stress degradation mechanism on advanced p-MOSFETs
Moonju Cho, Spessot, Alessio, Kaczer, Ben, Aoulaiche, Marc, Ritzenthaler, Romain, Schram, Tom, Fazan, Pierre, Horiguchi, Naoto, Linten, Dimitri
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
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Conference Proceeding
Interface/Bulk Trap Recovery After Submelt Laser Anneal and the Impact to NBTI Reliability
Moonju Cho, Aoulaiche, Marc, Degraeve, Robin, Ortolland, Claude, Kauerauf, Thomas, Kaczer, Ben, Roussel, Philippe, Hoffmann, Thomas Y, Groeseneken, Guido
Published in IEEE electron device letters (01.06.2010)
Published in IEEE electron device letters (01.06.2010)
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Journal Article
Oxide Trapping in the InGaAs- \hbox \hbox System and the Role of Sulfur in Reducing the \hbox\hbox Trap Density
Alian, Alireza, Brammertz, G., Degraeve, R., Moonju Cho, Merckling, C., Lin, Dennis, Wang, Wei-E, Caymax, M., Meuris, M., De Meyer, K., Heyns, M.
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
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Journal Article
Interface Trap Characterization of a 5.8- \hbox} EOT p-MOSFET Using High-Frequency On-Chip Ring Oscillator Charge Pumping Technique
Moonju Cho, Kaczer, B., Aoulaiche, M., Degraeve, R., Roussel, P., Franco, J., Kauerauf, T., Ragnarsson, L. Å, Hoffmann, T. Y., Groeseneken, G.
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
Scaling of BTI reliability in presence of time-zero variability
Kukner, Halil, Weckx, Pieter, Franco, Jacopo, Toledano-Luque, Maria, Moonju Cho, Kaczer, Ben, Raghavan, Praveen, Doyoung Jang, Miyaguchi, Kenichi, Bardon, Marie Garcia, Catthoor, Francky, Van der Perre, Liesbet, Lauwereins, Rudy, Groeseneken, Guido
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs
Spessot, Alessio, Ritzenthaler, Romain, Schram, Tom, Aoulaiche, Marc, Cho, Moonju, Luque, Maria Toledano, Horiguchi, Naoto, Fazan, Pierre
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
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Conference Proceeding
Positive and negative bias temperature instability on sub-nanometer eot high-K MOSFETs
Moonju Cho, Aoulaiche, M, Degraeve, R, Kaczer, B, Franco, J, Kauerauf, T, Roussel, P, Ragnarsson, L Å, Tseng, J, Hoffmann, T Y, Groeseneken, G
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Experimental identification of unique oxide defect regions by characteristic response of charge pumping
Masuduzzaman, M, Islam, A, Degraeve, R, Moonju Cho, Zahid, M, Alam, M
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Effects of gate process on NBTI characteristics of TiN gate FinFET
Jin Ju Kim, Moonju Cho, Pantisano, L., Chiarella, T., Togo, M., Horiguchi, N., Groeseneken, G., Byoung Hun Lee
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)
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Conference Proceeding
Study of the Reliability Impact of Chlorine Precursor Residues in Thin Atomic-Layer-Deposited \hbox Layers
Moonju Cho, Degraeve, R., Pourtois, G., Delabie, A., Ragnarsson, L.-A., Kauerauf, T., Groeseneken, G., De Gendt, S., Heyns, M., Cheol Seong Hwang
Published in IEEE transactions on electron devices (01.04.2007)
Published in IEEE transactions on electron devices (01.04.2007)
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Journal Article