Fabrication and Device Characterization of Omega-Shaped-Gate ZnO Nanowire Field-Effect Transistors
Keem, Kihyun, Jeong, Dong-Young, Kim, Sangsig, Lee, Moon-Sook, Yeo, In-Seok, Chung, U-In, Moon, Joo-Tae
Published in Nano letters (01.07.2006)
Published in Nano letters (01.07.2006)
Get full text
Journal Article
A stacked memory device on logic 3D technology for ultra-high-density data storage
Kim, Jiyoung, Hong, Augustin J, Kim, Sung Min, Shin, Kyeong-Sik, Song, Emil B, Hwang, Yongha, Xiu, Faxian, Galatsis, Kosmas, Chui, Chi On, Candler, Rob N, Choi, Siyoung, Moon, Joo-Tae, Wang, Kang L
Published in Nanotechnology (24.06.2011)
Published in Nanotechnology (24.06.2011)
Get full text
Journal Article
Experimental investigation of the impact of LWR on sub-100-nm device performance
Hyun-Woo Kim, Ji-Young Lee, Shin, J., Sang-Gyun Woo, Han-Ku Cho, Joo-Tae Moon
Published in IEEE transactions on electron devices (01.12.2004)
Published in IEEE transactions on electron devices (01.12.2004)
Get full text
Journal Article
Synchronous Pulse Plasma Operation upon Source and Bias Radio Frequencys for Inductively Coupled Plasma for Highly Reliable Gate Etching Technology
Tokashiki, Ken, Cho, Hong, Banna, Samer, Lee, Jeong-Yun, Shin, Kyoungsub, Todorow, Valentin, Kim, Woo-Seok, Bai, KeunHee, Joo, Sukho, Choe, Jeong-Dong, Ramaswamy, Kartik, Agarwal, Ankur, Rauf, Shahid, Collins, Ken, Choi, SangJun, Cho, Han, Kim, Hyun Joong, Lee, Changhun, Lymberopoulos, Dimitris, Yoon, Junho, Han, Woosung, Moon, Joo-Tae
Published in Japanese Journal of Applied Physics (01.08.2009)
Published in Japanese Journal of Applied Physics (01.08.2009)
Get full text
Journal Article
Etching characteristics and modeling for oval-shaped contact
Park, Sung-Chan, Lim, Seok-Hyun, Shin, Chul-Ho, Min, Gyung-Jin, Kang, Chang-Jin, Cho, Han-Ku, Moon, Joo-Tae
Published in Thin solid films (23.04.2007)
Published in Thin solid films (23.04.2007)
Get full text
Journal Article
Conference Proceeding
Spatial Distribution of Interface Traps in Sub-50-nm Recess-Channel-Type DRAM Cell Transistors
CHUNG, Eun-Ae, KIM, Young-Pil, MOON, Joo-Tae, KIM, Sangsig, PARK, Min-Chul, NAM, Kab-Jin, LEE, Sung-Sam, MIN, Ji-Young, YANG, Giyoung, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung
Published in IEEE electron device letters (01.01.2011)
Published in IEEE electron device letters (01.01.2011)
Get full text
Journal Article
Leakage Current Reduction Mechanism of Oxide--Nitride--Oxide Inter-Poly Dielectrics through the Post Plasma Oxidation Treatment
Lee, Woong, Jee, Jeonggeun, Yoo, Dae-Han, Lee, Eun-Young, Bok, Jinkwon, Hyung, Younwoo, Kim, Seoksik, Kang, Chang-Jin, Moon, Joo-Tae, Roh, Yonghan
Published in Japanese Journal of Applied Physics (01.04.2011)
Published in Japanese Journal of Applied Physics (01.04.2011)
Get full text
Journal Article
Low-Temperature Solid Phase Epitaxial Regrowth of Silicon for Stacked Static Random Memory Application
Lee, Kong-Soo, Yeo, Chadong, Yoo, Dae-Han, Kim, Seok-Sik, Moon, Joo-Tae, Jung, Soon-Moon, Son, Yong-Hoon, Park, Hyunho, Jeong, Hanwook, Kim, Kwang-Ryul, Choi, Byoungdeog
Published in Japanese Journal of Applied Physics (01.01.2011)
Published in Japanese Journal of Applied Physics (01.01.2011)
Get full text
Journal Article
Characterization of threshold voltage instability after program in charge trap flash memory
Bio Kim, SeungJae Baik, Sunjung Kim, Joon-Gon Lee, Bonyoung Koo, Siyoung Choi, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Effect of pre-existing void in sub-30nm Cu interconnect reliability
Zungsun Choi, Tsukasa, M, Jong Myeong Lee, Gil-Heyun Choi, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Get full text
Conference Proceeding
Gate oxide effect on wafer level reliability of next generation dram transistors
Yu Gyun Shin, Kab-Jin Nam, Heedon Hwang, Jeong Hee Han, Sangjin Hyun, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Get full text
Conference Proceeding
Novel Vertical-Stacked-Array-Transistor (VSAT) for ultra-high-density and cost-effective NAND Flash memory devices and SSD (Solid State Drive)
Jiyoung Kim, Hong, A.J., Sung Min Kim, Song, E.B., Jeung Hun Park, Jeonghee Han, Siyoung Choi, Deahyun Jang, Joo -Tae Moon, Wang, K.L.
Published in 2009 Symposium on VLSI Technology (01.06.2009)
Get full text
Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
Electromigration tests for critical stress and failure mechanism evaluation in Cu/W via/Al hybrid interconnect
Zungsun Choi, Byung-Lyul Park, Jong Myeong Lee, Gil-Heyun Choi, Hyeon-Deok Lee, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Electrical field dependence of data retention in high-k interpoly dielectrics
Chun-Hyung Chung, Seung-Hyun Lim, Sang-Wook Lim, Young-Sun Kim, Choi, S.Y., Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Innovative Al Damascene Process for Nanoscale Interconnects
Choi, Kyung-In, Han, Sung-Ho, Yun, Sera, Kim, Dae-Yong, Hong, Jong Won, Lee, Sang Woo, Kim, Byung Hee, Kim, Sung-Tae, Chung, U-In, Moon, Joo-Tae, Ryu, Byung-Il
Published in Japanese Journal of Applied Physics (01.04.2006)
Published in Japanese Journal of Applied Physics (01.04.2006)
Get full text
Journal Article
Most Efficient Alternative Manner of Patterning sub-80 nm Contact Holes and Trenches with 193 nm Lithography
Hah, Jung Hwan, Yoon, Jin-Young, Hata, Mitsuhiro, Kim, Sang Wook, Kim, Hyun-Woo, Woo, Sang-Gyoun, Cho, Han-Ku, Han, Woo-Sung, Moon, Joo-Tae, Ryu, Byoung-Il
Published in Japanese Journal of Applied Physics (01.06.2004)
Published in Japanese Journal of Applied Physics (01.06.2004)
Get full text
Journal Article
State of the art technologies and future prospective in display industry
Get full text
Conference Proceeding
Investigation of Chemical Vapor Deposition (CVD)-Derived Cobalt Silicidation for the Improvement of Contact Resistance
Kim, Hyun-Su, Yun, Jong-Ho, Moon, Kwang-Jin, Sohn, Woong-Hee, Jung, Sug-Woo, Jung, Eun-Ji, Kim, Se-Hoon, Bae, Nam-Jin, Choi, Gil-Heyun, Kim, Sung-Tae, Chung, U-In, Moon, Joo-Tae, Ryu, Byung-Il
Published in Japanese Journal of Applied Physics (01.06.2005)
Published in Japanese Journal of Applied Physics (01.06.2005)
Get full text
Journal Article
Improved Cell Performance for sub-50 nm DRAM with Manufacturable Bulk FinFET Structure
Deok-Hyung Lee, Sun-Ghil Lee, Jong Ryeol Yoo, Gyoung-Ho Buh, Guk Hyon Yon, Dong-Woon Shin, Dong Kyu Lee, Hyun-Sook Byun, In Soo Jung, Tai-su Park, Yu Gyun Shin, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Get full text
Conference Proceeding
Performance of DRAM Cell Transistor with Thermal Desorption Silicon Etching (TDSE) and Selective Si Channel Epi Techniques
Kim, Chul-Sung, Ku, Ja-Hum, Lee, Byeong-Chan, Yoo, Jong-Ryeol, Lee, Deok-Hyung, Choi, Siyoung, Chung, U-In, Moon, Joo-Tae
Published in Japanese Journal of Applied Physics (2003)
Published in Japanese Journal of Applied Physics (2003)
Get full text
Journal Article