SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET
Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit
Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lim, Jungman, Lee, Seungbae, Sagong, Hyun Chul, Pae, Sangwoo
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding