Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
Maconi, A., Arreghini, A., Monzio Compagnoni, C., Van den bosch, G., Spinelli, A.S., Van Houdt, J., Lacaita, A.L.
Published in Solid-state electronics (01.08.2012)
Published in Solid-state electronics (01.08.2012)
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Journal Article
Impact of Program Accuracy and Random Telegraph Noise on the Performance of a NOR Flash-based Neuromorphic Classifier
Malavena, G., Petro, S., Spinelli, A. S., Monzio Compagnoni, C.
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
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Conference Proceeding
Investigation of the Moisture- Driven Dynamics of Time- Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolators
Greatti, M., Mazzola, J. L., Compagnoni, C. Monzio, Spinelli, A. S., Paci, D., Speroni, F., Marano, V., Lauria, M., Malavena, G.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Modeling the Temperature Dependence of TDDB in Galvanic Isolators Based on Polymeric Dielectrics
Mazzola, J. L., Greatti, M., Compagnoni, C. Monzio, Spinelli, A.S., Marano, V., Lauria, M., Paci, D., Speroni, F., Malavena, G.
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
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Conference Proceeding
Statistical Model for Random Telegraph Noise in Flash Memories
Monzio Compagnoni, C., Gusmeroli, R., Spinelli, A.S., Lacaita, A.L., Bonanomi, M., Visconti, A.
Published in IEEE transactions on electron devices (01.01.2008)
Published in IEEE transactions on electron devices (01.01.2008)
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Journal Article
Impact of the array background pattern on cycling-induced threshold-voltage instabilities in nanoscale NAND Flash memories
Paolucci, G.M., Bertuccio, M., Monzio Compagnoni, C., Beltrami, S., Spinelli, A.S., Lacaita, A.L., Visconti, A.
Published in Solid-state electronics (01.11.2015)
Published in Solid-state electronics (01.11.2015)
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Journal Article
Comparison of Modeling Approaches for the Capacitance-Voltage and Current-Voltage Characteristics of Advanced Gate Stacks
Palestri, P., Gusmeroli, R., Iannaccone, G., Karner, M., Kosina, H., Lacaita, A. L., Langer, E., Majkusiak, B., Compagnoni, C. Monzio, Poncet, A., Sangiorgi, E., Barin, N., Selmi, L., Spinelli, A. S., Walczak, J., Brunel, D., Busseret, C., Campera, A., Childs, P. A., Driussi, F., Fiegna, C., Fiori, G.
Published in IEEE transactions on electron devices (01.01.2007)
Published in IEEE transactions on electron devices (01.01.2007)
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Journal Article
Investigation of the Electron-Injection Spread in Barrier-Engineered NAND Flash Memories
Monzio Compagnoni, C., Gusmeroli, R., Ghidotti, M., Spinelli, A.S., Visconti, A.
Published in IEEE electron device letters (01.07.2009)
Published in IEEE electron device letters (01.07.2009)
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Journal Article
Investigation of the Statistical Spread of the Time-Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolation
Malavena, G., Mazzola, J. L., Greatti, M., Compagnoni, C. Monzio, Lacaita, A. L., Marano, V., Lauria, M., Paci, D., Speroni, F., Spinelli, A. S.
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)
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Conference Proceeding
Edge and percolation effects on VT window in nanocrystal memories
Gusmeroli, R., Spinelli, A.S., Compagnoni, C. Monzio, Ielmini, D., Lacaita, A.L.
Published in Microelectronic engineering (17.06.2005)
Published in Microelectronic engineering (17.06.2005)
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Journal Article
Conference Proceeding
Impact of temperature on the amplitude of RTN fluctuations in 3-D NAND flash cells
Nicosia, G., Mannara, A., Resnati, D., Paolucci, G. M., Tessariol, P., Lacaita, A. L., Spinelli, A. S., Goda, A., Compagnoni, C. Monzio
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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Conference Proceeding
A new channel percolation model for VT shift in discrete-trap memories
IELMINI, D, COMPAGNONI, C. Monzio, SPINELLI, A. S, LACAITA, A. L, GERARDI, C
Year of Publication 2004
Year of Publication 2004
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Conference Proceeding
Electrode-dependent asymmetric conduction mechanisms in K0.5Na0.5NbO3 micro-capacitors
Groppi, C., Maspero, F., Rovelli, A., Asa, M., Malavena, G., Compagnoni, C. Monzio, Albisetti, E., Vangelista, S., Badillo-Ávila, M.A., Bertacco, R.
Published in Materials science in semiconductor processing (15.06.2023)
Published in Materials science in semiconductor processing (15.06.2023)
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Journal Article
Transient currents in HfO2 and their impact on circuit and memory applications
Compagnoni, C.M., Spinelli, A.S., Bianchini, A., Lacaita, A.L., Spiga, S., Fanciulli, M.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)
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Conference Proceeding
A single-electron analysis of NAND flash memory programming
Nicosia, G., Paolucci, G. M., Compagnoni, C. Monzio, Resnati, D., Miccoli, C., Spinelli, A. S., Lacaita, A. L., Visconti, A., Goda, A.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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Conference Proceeding
Journal Article
Degradation Dynamics for Deep Scaled p-MOSFET's during Hot-Carrier Stress
Compagnoni, C.M., Pirovano, A., Lacaita, A.L.
Published in 32nd European Solid-State Device Research Conference (2002)
Published in 32nd European Solid-State Device Research Conference (2002)
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Conference Proceeding
Impact of atomistic doping and 3D electrostatics on the variability of RTN time constants in flash memories
Mauri, A., Castellani, N., Compagnoni, C. M., Ghetti, A., Cappelletti, P., Spinelli, A. S., Lacaita, A. L.
Published in 2011 International Electron Devices Meeting (01.12.2011)
Published in 2011 International Electron Devices Meeting (01.12.2011)
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Conference Proceeding