E-Beam Hot Spot Inspection for Early Detection of Systematic Patterning Problems for a 22 nm SOI Technology
Patterson, Oliver D., Ryan, Deborah A., Monkowski, Michael D., Nguyen-Ngoc, Dominique, Morgenfeld, Bradley, Chung-Han Lee, Chieh-Hung Liu, Chi-Ming Chan, Shih-Tsung Chen, Lei, Shuen-Cheng Chris
Published in IEEE transactions on semiconductor manufacturing (01.11.2014)
Published in IEEE transactions on semiconductor manufacturing (01.11.2014)
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Journal Article
Methods and apparatus for generating dialog state conditioned language models
VISWESWARIAH KARTHIK, PRINTZ HARRY W, MONKOWSKI MICHAEL D, DHARANIPRAGADA SATYANARAYANA
Year of Publication 28.12.2006
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Year of Publication 28.12.2006
Patent