by Weber, O., Josse, E., Andrieu, F., Cros, A., Richard, E., Perreau, P., Baylac, E., Degors, N., Gallon, C., Perrin, E., Chhun, S., Petitprez, E., Delmedico, S., Simon, J., Druais, G., Lasserre, S., Mazurier, J., Guillot, N., Bernard, E., Bianchini, R., Parmigiani, L., Gerard, X., Pribat, C., Gourhant, O., Abbate, F., Gaumer, C., Beugin, V., Gouraud, P., Maury, P., Lagrasta, S., Barge, D., Loubet, N., Beneyton, R., Benoit, D., Zoll, S., Chapon, J.-D., Babaud, L., Bidaud, M., Gregoire, M., Monget, C., Le-Gratiet, B., Brun, P., Mellier, M., Pofelski, A., Clement, L.R., Bingert, R., Puget, S., Kruck, J.-F., Hoguet, D., Scheer, P., Poiroux, T., Manceau, J.-P., Rafik, M., Rideau, D., Jaud, M.-A., Lacord, J., Monsieur, F., Grenouillet, L., Vinet, M., Liu, Q., Doris, B., Celik, M., Fetterolf, S.P., Faynot, O., Haond, M.
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)

by Arnaud, L., Cacho, F., Doyen, L., Terrier, F., Galpin, D., Monget, C.
Published in Microelectronic engineering (01.03.2010)

by Hamioud, K., Arnal, V., Farcy, A., Jousseaume, V., Zenasni, A., Icard, B., Pradelles, J., Manakli, S., Brun, Ph, Imbert, G., Jayet, C., Assous, M., Maitrejean, S., Galpin, D., Monget, C., Guillan, J., Chhun, S., Richard, E., Barbier, D., Haond, M.
Published in Microelectronic engineering (01.03.2010)

by Arnaud, L., Cacho, F., Doyen, L., Terrier, F., Galpin, D., Monget, C.
Published in Microelectronic engineering (01.03.2010)

by Guillan, J., Haxaire, K., Chhun, S., Richard, E., Luche, M.C., Arnaud, L., Petitprez, E., Monget, C., Galpin, D., Normandon, P.
Published in Microelectronic engineering (01.05.2011)

by Gosset, L.G, Arnal, V, Brun, Ph, Broekaart, M, Monget, C, Casanova, N, Rivoire, M, Oberlin, J.-C, Torres, J
Published in Microelectronic engineering (01.11.2003)

by MONGET, C, VALLON, S, BELL, F. H, VALLIER, L, JOUBERT, O
Published in Journal of the Electrochemical Society (01.07.1997)

by Monget, C., Fuard, D., Joubert, O., Panabière, J.P.
Published in Microelectronic engineering (1999)

by Guillan, J., Haxaire, K., Chhun, S., Richard, E., Luche, M.C., Arnaud, L., Petitprez, E., Monget, C., Galpin, D., Normandon, P.
Published in Microelectronic engineering (01.05.2011)

by Vilmay, M., Roy, D., Monget, C., Volpi, F., Chaix, J.-M.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)

by Hamioud, K., Arnal, V., Farcy, A., Jousseaume, V., Zenasni, A., Icard, B., Pradelles, J., Manakli, S., Brun, Ph, Imbert, G., Jayet, C., Assous, M., Maitrejean, S., Galpin, D., Monget, C., Guillan, J., Chhun, S., Richard, E., Barbier, D., Haond, M.
Published in Microelectronic engineering (01.03.2010)

by Hinsinger, O., Fox, R., Sabouret, E., Goldberg, C., Verove, C., Besling, W., Brun, P., Josse, E., Monget, C., Belmont, O., Van Hassel, J., Sharma, B.G., Jacquemin, J.P., Vannier, P., Humbert, A., Bunel, D., Gonella, R., Mastromatteo, E., Reber, D., Farcy, A., Mueller, J., Christie, P., Nguyen, V.H., Cregut, C., Berger, T.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)

by Vilmay, M., Roy, D., Monget, C., Volpi, F., Chaix, J-M.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Vilmay, M., Roy, D., Monget, C., Volpi, F., Chaix, J.-M.
Published in IEEE transactions on device and materials reliability (01.06.2009)

by Vilmay, M., Roy, D., Monget, C., Volpi, F., Chaix, J.-M.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Richard, E., Mellier, M., Petitdidier, S., Delsol, R., Besling, W., Marinier, L., Imbert, G., Lagha, A., Broussous, L., Rasco, M., Cregut, C., Fox, R., Downey, S., Huang, G., Haond, M., Cave, N., Perera, A., Monget, C., Zaleski, M., Ferreira, P., Guvenilir, A., Brun, P., Ollier, E., Guillermet, M.
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)

by Posseme, N., Bouyssou, R., Chevolleau, T., David, T., Arnal, V., Chhun, S., Monget, C., Richard, E., Galpin, D., Guillan, J., Arnaud, L., Roy, D., Guillermet, M., Ramard, J., Joubert, O., Verove, C.
Published in 2009 IEEE International Interconnect Technology Conference (01.06.2009)

by Arnaud, L., Galpin, D., Chhun, S., Monget, C., Richard, E., Roy, D., Besset, C., Vilmay, M., Doyen, L., Waltz, P., Petitprez, E., Terrier, F., Imbert, G., Le Friec, Y.
Published in 2009 IEEE International Interconnect Technology Conference (01.06.2009)

by Vilmay, M., Roy, D., Besset, C., Galpin, D., Monget, C., Vannier, P., Le Friec, Y., Imbert, G., Mellier, M., Petitdidier, S., Robin, O., Guillan, J., Chhun, S., Arnaud, L., Volpi, F., Chaix, J.-M.
Published in 2009 IEEE International Interconnect Technology Conference (01.06.2009)

by Josse, E., Parihar, S., Callen, O., Ferreira, P., Monget, C., Farcy, A., Zaleski, M., Villanueva, D., Ranica, R., Bidaud, M., Barge, D., Laviron, C., Auriac, N., Le Cam, C., Harrison, S., Warrick, S., Leverd, F., Gouraud, P., Zoll, S., Guyader, F., Perrin, E., Baylac, E., Belledent, J., Icard, B., Minghetti, B., Manakli, S., Pain, L., Huard, V., Ribes, G., Rochereau, K., Bordez, S., Blanc, C., Margain, A., Delille, D., Pantel, R., Barla, K., Cave, N., Haond, M.
Published in 2006 International Electron Devices Meeting (01.12.2006)