Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests
Goiffon, Vincent, Corbiere, Franck, Rolando, Sebastien, Estribeau, Magali, Magnan, Pierre, Avon, Barbara, Baer, Jeremy, Gaillardin, Marc, Molina, Romain, Paillet, Philippe, Girard, Sylvain, Chabane, Aziouz, Cervantes, Paola, Marcandella, Claude
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors
Goiffon, Vincent, Estribeau, Magali, Cervantes, Paola, Molina, Romain, Gaillardin, Marc, Magnan, Pierre
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors
Belloir, Jean-Marc, Goiffon, Vincent, Virmontois, Cédric, Raine, Mélanie, Paillet, Philippe, Duhamel, Olivier, Gaillardin, Marc, Molina, Romain, Magnan, Pierre, Gilard, Olivier
Published in Optics express (22.02.2016)
Published in Optics express (22.02.2016)
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Dark Current Spectroscopy in Neutron, Proton and Ion Irradiated CMOS Image Sensors: From Point Defects to Clusters
Belloir, Jean-Marc, Goiffon, Vincent, Virmontois, Cedric, Paillet, Philippe, Raine, Melanie, Molina, Romain, Durnez, Clementine, Gilard, Olivier, Magnan, Pierre
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose
Goiffon, V., Estribeau, M., Marcelot, O., Cervantes, P., Magnan, P., Gaillardin, M., Virmontois, C., Martin-Gonthier, P., Molina, R., Corbiere, F., Girard, S., Paillet, P., Marcandella, C.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Annealing effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses
Dewitte, Hugo, Rizzolo, Serena, Paillet, Philippe, Magnan, Pierre, Le Roch, Alexandre, Corbiere, Franck, Molina, Romain, Girard, Sylvain, Allanche, Timothé, Muller, Cyprien, Desjonqueres, Hortense, Mace, Jean-Reynald, Baudu, Jean-Pierre, Saravia Flores, Alvaro, Goiffon, Vincent
Published in IEEE transactions on nuclear science (12.06.2020)
Published in IEEE transactions on nuclear science (12.06.2020)
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Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels
Rizzolo, Serena, Goiffon, Vincent, Corbiere, Franck, Molina, Romain, Chabane, Aziouz, Girard, Sylvain, Paillet, Philippe, Magnan, Pierre, Boukenter, Aziz, Allanche, Timothe, Muller, Cyprien, Monsanglant-Louvet, Celine, Osmond, Melanie, Desjonqueres, Hortense, Mace, Jean-Reynald, Burnichon, Pierre, Baudu, Jean-Pierre, Plumeri, Stephane
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI
Marcelot, Olivier, Estribeau, Magali, Goiffon, Vincent, Martin-Gonthier, Philippe, Corbiere, Franck, Molina, Romain, Rolando, Sebastien, Magnan, Pierre
Published in IEEE transactions on electron devices (01.03.2014)
Published in IEEE transactions on electron devices (01.03.2014)
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Radiation Effects in CCD on CMOS Devices: First Analysis of TID and DDD Effects
Marcelot, O., Goiffon, V., Raine, M., Duhamel, O., Gaillardin, M., Molina, R., Magnan, P.
Published in IEEE transactions on electron devices (01.12.2015)
Published in IEEE transactions on electron devices (01.12.2015)
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Smart CMOS image sensor for lightning detection and imaging
Rolando, Sébastien, Goiffon, Vincent, Magnan, Pierre, Corbière, Franck, Molina, Romain, Tulet, Michel, Bréart-de-Boisanger, Michel, Saint-Pé, Olivier, Guiry, Saïprasad, Larnaudie, Franck, Leone, Bruno, Perez-Cuevas, Leticia, Zayer, Igor
Published in Applied optics. Optical technology and biomedical optics (01.03.2013)
Published in Applied optics. Optical technology and biomedical optics (01.03.2013)
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