Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation
Mokaberi, B., Requicha, A.A.G.
Published in IEEE transactions on automation science and engineering (01.04.2008)
Published in IEEE transactions on automation science and engineering (01.04.2008)
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Journal Article
Drift compensation for automatic nanomanipulation with scanning probe microscopes
Mokaberi, B., Requicha, A.A.G.
Published in IEEE transactions on automation science and engineering (01.07.2006)
Published in IEEE transactions on automation science and engineering (01.07.2006)
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Journal Article
Automated Nanomanipulation with Atomic Force Microscopes
Mokaberi, B., Jaehong Yun, Wang, M., Requicha, A.A.G.
Published in Proceedings 2007 IEEE International Conference on Robotics and Automation (01.04.2007)
Published in Proceedings 2007 IEEE International Conference on Robotics and Automation (01.04.2007)
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Conference Proceeding