Improvement of Negative Bias Stress Stability in Mg0.03Zn0.97O Thin-Film Transistors
Chieh-Jen Ku, Wen-Chiang Hong, Mohsin, Tanvir, Rui Li, Ziqing Duan, Yicheng Lu
Published in IEEE electron device letters (01.09.2015)
Published in IEEE electron device letters (01.09.2015)
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