Trends in the ultimate breakdown strength of high dielectric-constant materials
McPherson, J.W., Jinyoung Kim, Shanware, A., Mogul, H., Rodriguez, J.
Published in IEEE transactions on electron devices (01.08.2003)
Published in IEEE transactions on electron devices (01.08.2003)
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Journal Article
Insulin like growth factor-binding protein-1 as a marker for hyperinsulinemia in obese menopausal women
MOGUL, H. R, MARSHALL, M, FREY, M, BURKE, H. B, WYNN, P. S, WILKER, S, SOUTHREN, A. L, GAMBERT, S. R
Published in The journal of clinical endocrinology and metabolism (01.12.1996)
Published in The journal of clinical endocrinology and metabolism (01.12.1996)
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Journal Article
Characterization of Defect Formation during Ni Silicidation for CMOS Device Application
Ko, K-S, Crank, S, Chen, P, Yue, D, Lavangkul, S, Mogul, H, Siddiqui, S, Bonifield, T
Published in Microscopy and microanalysis (01.08.2005)
Published in Microscopy and microanalysis (01.08.2005)
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Journal Article
Si oxyhydrides on stain-etched porous Si thin films and correlation with crystallinity and photoluminescence
STECKL, A. J, XU, J, MOGUL, H. C, PROKES, S. M
Published in Journal of the Electrochemical Society (01.05.1995)
Published in Journal of the Electrochemical Society (01.05.1995)
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Journal Article
Metformin and carbohydrate-modified diet: a novel obesity treatment protocol: preliminary findings from a case series of nondiabetic women with midlife weight gain and hyperinsulinemia
Mogul, H R, Peterson, S J, Weinstein, B I, Zhang, S, Southren, A L
Published in Heart disease (Hagerstown, Md.) (01.09.2001)
Published in Heart disease (Hagerstown, Md.) (01.09.2001)
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Journal Article
Building-in reliability into VLSI junctions
Mogul, H.C., McPherson, J.W., Parrill, T.M.
Published in IEEE transactions on semiconductor manufacturing (01.11.1997)
Published in IEEE transactions on semiconductor manufacturing (01.11.1997)
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Journal Article
Proposed universal relationship between dielectric breakdown and dielectric constant
McPherson, J., Kim, J., Shanware, A., Mogul, H., Rodriguez, J.
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Advantages of LDD-only implanted fluorine with submicron CMOS technologies
Mogul, H.C., Rost, T.A., Der-Gao Lin
Published in IEEE transactions on electron devices (01.03.1997)
Published in IEEE transactions on electron devices (01.03.1997)
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Journal Article
Emerging floating-body effects in advanced partially-depleted SOI devices
POIROUX, T, FAVNOT, O, TABONE, C, TIGELAAR, H, MOGUL, H, BRESSON, N, CRISTOLOVEANU, S
Published in 2002 IEEE International SOI Conference (2002)
Published in 2002 IEEE International SOI Conference (2002)
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Conference Proceeding
Requirement of effective fabless/foundry interactions for achieving robust product reliability
Kalpat, S, Mogul, H, Hau-Riege, C, Hnatek, E R, Liu, J H, You-Wen Yau
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
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Conference Proceeding
A 65 nm CMOS technology for mobile and digital signal processing applications
Chatterjee, A., Yoon, J., Zhao, S., Tang, S., Sadra, K., Crank, S., Mogul, H., Aggarwal, R., Chatterjee, B., Lytle, S., Lin, C.T., Lee, K.D., Kim, J., Hong, Q.Z., Kim, T., Olsen, L., Quevedo-Lopez, M., Kirmse, K., Zhang, G., Meek, C., Aldrich, D., Mair, H., Mehrotra, M., Adam, L., Mosher, D., Yang, J.Y., Crenshaw, D., Williams, B., Jacobs, J., Jain, M., Rosal, J., Houston, T., Wu, J., Nagaraj, N.S., Scott, D., Ashburn, S., Tsao, A.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
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Conference Proceeding
Inguinal herniography in children
Melnick, A, Levyn, M E, Mogul, H N, Berger, R
Published in The Journal of the American Osteopathic Association (01.08.1975)
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Published in The Journal of the American Osteopathic Association (01.08.1975)
Journal Article
Physical properties of tetra-n-alkylgermanes (C1-C6)
Mogul, Philip H, Hochberg, Marc C, Michiel, Robert, Nestel, Glenn K, Wamsley, Brian L, Coren, Seth D
Published in Journal of chemical and engineering data (01.01.1974)
Published in Journal of chemical and engineering data (01.01.1974)
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Journal Article