by Capogreco, E., Witters, L., Arimura, H., Sebaai, F., Porret, C., Hikavyy, A., Loo, R., Milenin, A. P., Eneman, G., Favia, P., Bender, H., Wostyn, K., Dentoni Litta, E., Schulze, A., Vrancken, C., Opdebeeck, A., Mitard, J., Langer, R., Holsteyns, F., Waldron, N., Barla, K., De Heyn, V., Mocuta, D., Collaert, N.
Published in IEEE transactions on electron devices (01.11.2018)

by Ryckaert, J., Schuddinck, P., Weckx, P., Bouche, G., Vincent, B., Smith, J., Sherazi, Y., Mallik, A., Mertens, H., Demuynck, S., Bao, T. Huynh, Veloso, A., Horiguchi, N., Mocuta, A., Mocuta, D., Boemmels, J.
Published in 2018 IEEE Symposium on VLSI Technology (01.06.2018)

by Veloso, A, Matagne, P, Simoen, E, Kaczer, B, Eneman, G, Mertens, H, Yakimets, D, Parvais, B, Mocuta, D
Published in Journal of physics. Condensed matter (26.09.2018)

by Witters, L., Arimura, H., Sebaai, F., Hikavyy, A., Milenin, A. P., Loo, R., De Keersgieter, A., Eneman, G., Schram, T., Wostyn, K., Devriendt, K., Schulze, A., Lieten, R., Bilodeau, S., Cooper, E., Storck, P., Chiu, E., Vrancken, C., Favia, P., Vancoille, E., Mitard, J., Langer, R., Opdebeeck, A., Holsteyns, F., Waldron, N., Barla, K., De Heyn, V., Mocuta, D., Collaert, N.
Published in IEEE transactions on electron devices (01.11.2017)

by Qiu, Y, Bender, H, Richard, O, Kim, M-S, Van Besien, E, Vos, I, de Potter de ten Broeck, M, Mocuta, D, Vandervorst, W
Published in Scientific reports (04.08.2015)

by Arimura, H., Dekkers, H., Ragnarsson, L.-A., Mitard, J., De Heyn, V., Mocuta, D., Collaert, N., Horiguchi, N., Cott, D., Boccardi, G., Loo, R., Wostyn, K., Witters, L., Conard, T., Suhard, S., van Dorp, D.
Published in IEEE transactions on electron devices (01.12.2019)

by Vandooren, A., Franco, J., Parvais, B., Wu, Z., Witters, L., Walke, A., Li, W., Peng, L., Deshpande, V., Bufler, F. M., Rassoul, N., Hellings, G., Jamieson, G., Inoue, F., Verbinnen, G., Devriendt, K., Teugels, L., Heylen, N., Vecchio, E., Zheng, T., Rosseel, E., Vanherle, W., Hikavyy, A., Chan, B. T., Ritzenthaler, R., Besnard, G., Schwarzenbach, W., Gaudin, G., Radu, I., Nguyen, B.-Y., Waldron, N., De Heyn, V., Mocuta, D., Collaert, N.
Published in IEEE transactions on electron devices (01.11.2018)

by Mertens, H., Ritzenthaler, R., Hikavyy, A., Kim, M. S., Tao, Z., Wostyn, K., Chew, S. A., De Keersgieter, A., Mannaert, G., Rosseel, E., Schram, T., Devriendt, K., Tsvetanova, D., Dekkers, H., Demuynck, S., Chasin, A., Van Besien, E., Dangol, A., Godny, S., Douhard, B., Bosman, N., Richard, O., Geypen, J., Bender, H., Barla, K., Mocuta, D., Horiguchi, N., Thean, A. V-Y
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)

by Loo, R., Hikavyy, A. Y., Witters, L., Schulze, A., Arimura, H., Cott, D., Mitard, J., Porret, C., Mertens, H., Ryan, P., Wall, J., Matney, K., Wormington, M., Favia, P., Richard, O., Bender, H., Thean, A., Horiguchi, N., Mocuta, D., Collaert, N.
Published in ECS journal of solid state science and technology (01.01.2017)

by Witters, L., Mitard, J., Loo, R., Demuynck, S., Chew, S. A., Schram, T., Tao, Z., Hikavyy, A., Sun, J. W., Milenin, A. P., Mertens, H., Vrancken, C., Favia, P., Schaekers, M., Bender, H., Horiguchi, N., Langer, R., Barla, K., Mocuta, D., Collaert, N., Thean, A. V.-Y
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Kikuchi, Y., Chiarella, T., De Roest, D., Blanquart, T., De Keersgieter, A., Kenis, K., Peter, A., Ong, P., Van Besien, E., Tao, Z., Kim, M. S., Kubicek, S., Chew, S. A., Schram, T., Demuynck, S., Mocuta, A., Mocuta, D., Horiguchi, N.
Published in IEEE electron device letters (01.09.2016)

by Mertens, H., Ritzenthaler, R., Arimura, H., Franco, J., Sebaai, F., Hikavyy, A., Pawlak, B. J., Machkaoutsan, V., Devriendt, K., Tsvetanova, D., Milenin, A. P., Witters, L., Dangol, A., Vancoille, E., Bender, H., Badaroglu, M., Holsteyns, F., Barla, K., Mocuta, D., Horiguchi, N., Thean, A. V.-Y
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Raghavan, P., Bardon, M. Garcia, Jang, D., Schuddinck, P., Yakimets, D., Ryckaert, J., Mercha, A., Horiguchi, N., Collaert, N., Mocuta, A., Mocuta, D., Tokei, Z., Verkest, D., Thean, A., Steegen, A.
Published in 2015 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2015)

by Patterson, O.D., Wu, K., Mocuta, D., Nafisi, K.
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)

by Rim, K., Anderson, R., Boyd, D., Cardone, F., Chan, K., Chen, H., Christansen, S., Chu, J., Jenkins, K., Kanarsky, T., Koester, S., Lee, B.H., Lee, K., Mazzeo, V., Mocuta, A., Mocuta, D., Mooney, P.M., Oldiges, P., Ott, J., Ronsheim, P., Roy, R., Steegen, A., Yang, M., Zhu, H., Ieong, M., Wong, H.-S.P.
Published in Solid-state electronics (01.07.2003)

by Szasz, F., Pop, T., Craiut, D., Herczegh, R., Mocuta, D., Bodog, A., Noja, C.
Published in International journal of gynecology and obstetrics (01.10.2009)

by Sasaki, Y., Ritzenthaler, R., De Keersgieter, A., Chiarella, T., Kubicek, S., Rosseel, E., Waite, A., del Agua Borniquel, J., Colombeau, B., Chew, S. A., Kim, M. S., Schram, T., Demuynck, S., Vandervorst, W., Horiguchi, N., Mocuta, D., Mocuta, A., Thean, A. V.-Y
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Fen Chen, Mittl, S., Shinosky, M., Dufresne, R., Aitken, J., Yanfeng Wang, Kolvenback, K., Henson, W. K., Mocuta, D.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Shen, X.J., Kwak, H., Radojevic, A.M., Smadici, S., Mocuta, D., Osgood, R.M.
Published in Chemical physics letters (04.01.2002)

by Yang, B F., Ren, Zhibin, Takalkar, Rohit, Black, Linda R., Dube, Abhishek, Weijtmans, J. W., Li, John, Chan, K, Souza, J P de, Madan, Anita, Xia, G., Zhu, Zhengmao, Faltermeier, J., Reznicek, A., Adam, Thomas N., Chakravarti, Ashima, Pei, G, Pal, Rohit, Yang, B, Harley, Eric C., Greene, B, Gehring, A, Cai, M, Sadana, D, Park, D, Mocuta, D, Schepis, Dominic J., Maciejewski, E, Luning, S, Leobandung, E
Published in ECS transactions (2009)