by Han, Shu-Jen, Guo, Dechao, Wang, Xinlin, Mocuta, A.C, Henson, W.K, Rim, Ken
Published in IEEE electron device letters (01.12.2009)

by Shu-Jen Han, Dechao Guo, Xinlin Wang, Mocuta, A.C., Henson, W.K., Ken Rim
Published in IEEE electron device letters (01.12.2009)

by Mocuta, A.C., Greve, D.W.
Published in IEEE electron device letters (01.06.2000)

by Mocuta, A.C., Greve, D.W.
Published in IEEE electron device letters (01.06.2000)

by Mocuta, A.C, Greve, D.W
Published in IEEE electron device letters (01.06.2000)

by Yamashita, T., Fisher, P.A., Gluschenkov, O., Kimura, H., Ramachandran, R., Mocuta, A.C., Kluth, J., Kawamura, T., Onishi, K., Fried, D., Narasimha, S., Brown, D., Sameer Jain, Miyamoto, K., Freeman, G., Deshpande, S.V., Luning, S., Shih-Fen Huang, Pellerin, J., Kuroda, H.
Published in 2006 European Solid-State Device Research Conference (01.09.2006)

by Kawanaka, S., Utomo, H., Nii, H., Harifuchi, H., Sudo, G., Rausch, W., Kimura, H., Nakao, T., Park, H., Oh, S.-H., Waite, A., Ketchen, M.B., Womack, S., Narasimha, S., Mocuta, A.C., Ajmera, A., Li, Y., Malik, R., Kohyama, Y., Cheek, J., Yang, I., Clark, W.F., Bhushan, M., Divakaruni, R., Pearson, D.J., Bhasin, R., Mcstay, K., Sherony, M., Fisher, P., Matsumoto, K.
Published in 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) (2004)

by Mocuta, A.C., Hook, T.B., Chou, A.I., Wagner, T., Stamper, A.K., Khare, M., Gambino, J.P.
Published in 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538) (2001)

by Park, H., Schepis, D., Mocuta, A.C., Khare, M., Li, Y., Doris, B., Shukla, S., Hughes, T., Dokumaci, O., Narasimha, S., Fung, S., Snare, J., Lee, B.H., Li, J., Ronsheim, P., Domenicucci, A., Varekamp, P., Ajmera, A., Sleight, J., O'Neil, P., Maciejewski, E., Lavoie, C.
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)

by Park, H., Clark, W., Mocuta, A.C., Holt, J., Mo, R., Sato, T., Mocuta, D., Lee, B.H., Dokumaci, O., O'Neil, P., Brown, D., Rausch, W., Suenaga, J., Li, Y., Brown, L., Nakos, J., Hathorn, K., Ronsheim, P., Kimura, H., Doris, B., Sudo, G., Scheer, K., Utomo, H., Mittl, S., Wagner, T., Umebayashi, T., Tsukamoto, M., Kohyama, Y., Cheek, J., Yang, I., Kuroda, H., Toyoshima, Y., Pellerin, J., Matsumoto, K., Schepis, D., Agnello, P., Welser, J., Nii, H., Kawanaka, S., Fisher, P., Oh, S.-H., Snare, J.
Published in IEEE International Electron Devices Meeting 2003 (2003)

by Narasimha, S., Ajmera, A., Park, H., Schepis, D., Zamdmer, N., Jenkins, K.A., Plouchart, J.-O., Lee, W.-H., Mezzapelle, J., Bruley, J., Doris, B., Sleight, J.W., Fung, S.K., Ku, S.H., Mocuta, A.C., Yang, I., Gilbert, P.V., Muller, K.P., Agnello, P., Welser, J.
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)