by Muller, D. A, Sorsch, T, Moccio, S, Baumann, F. H, Evans-Lutterodt, K, Timp, G
Published in Nature (London) (24.06.1999)

by GREEN, M. L, SORSCH, T. W, TIMP, G. L, MULLER, D. A, WEIR, B. E, SILVERMAN, P. J, MOCCIO, S. V, KIM, Y. O
Published in Microelectronic engineering (01.09.1999)

by Timp, G, Bude, J, Baumann, F, Bourdelle, K.K, Boone, T, Garno, J, Ghetti, A, Green, M, Gossmann, H, Kim, Y, Kleiman, R, Kornblit, A, Klemens, F, Moccio, S, Muller, D, Rosamilia, J, Silverman, P, Sorsch, T, Timp, W, Tennant, D, Tung, R, Weir, B
Published in Microelectronics and reliability (01.04.2000)

by Timp, G., Agarwal, A., Baumann, F.H., Boone, T., Buonanno, M., Cirelli, R., Donnelly, V., Foad, M., Grant, D., Green, M., Gossmann, H., Hillenius, S., Jackson, J., Jacobson, D., Kleiman, R., Komblit, A., Klemens, F., Lee, J.T.-C., Mansfield, W., Moccio, S., Murrell, A., O'Malley, M., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tai, W.W., Tennant, D., Vuong, H., Weir, B.
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)

by Timp, G., Bourdelle, K.K., Bower, J.E., Baumann, F.H., Boone, T., Cirelli, R., Evans-Lutterodt, K., Garno, J., Ghetti, A., Gossmann, H., Green, M., Jacobson, D., Kim, Y., Kleiman, R., Klemens, F., Kornlit, A., Lochstampfor, C., Mansfield, W., Moccio, S., Muller, D.A., Ocola, I.E., O'Malley, M.I., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tennant, D.M., Timp, W., Weir, B.E.
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)

by Alam, M.A., Bude, J., Weir, B., Silverman, P., Ghetti, A., Monroe, D., Cheung, K.P., Moccio, S.
Published in International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) (1999)

by Green, M L, Sorsch, T W, Timp, G L, Muller, D A, Weir, B E, Silverman, P J, Moccio, S V, Kim, Y O
Published in Microelectronic engineering (01.01.1999)

by Timp, G., Bude, J., Bourdelle, K.K., Garno, J., Ghetti, A., Gossmann, H., Green, M., Forsyth, G., Kim, Y., Kleiman, R., Klemens, F., Kornblit, A., Lochstampfor, C., Mansfield, W., Moccio, S., Sorsch, T., Tennant, D.M., Timp, W., Tung, R.
Published in International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) (1999)

by Sorsch, T., Timp, W., Baumann, F.H., Bogart, K.H.A., Boone, T., Donnelly, V.M., Green, M., Evans-Lutterodt, K., Kim, C.Y., Moccio, S., Rosamilia, J., Sapjeta, J., Silvermann, P., Weir, B., Timp, G.
Published in 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) (1998)

by Timp, G., Agarwal, A., Bourdella, K.K., Bower, J., Boone, T., Ghetti, A., Green, M., Gamo, J., Gossmann, H., Jacobson, D., Kleiman, R., Kornblit, A., Klemens, F., Moccio, S., O'Malley, M.L., Ocola, L., Rossm-nalia, J., Sapjeta, J., Silverman, P., Sorsch, T., Timp, W., Tennani, D.
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)

by BRIAN KENNETH SULLIVAN, JOSHUA ROBERT HEMPHILL, CRAIG ANGELO MOCCIO
Year of Publication 10.05.2019

by KESTEN JOSHUA R, WHEELER JOHN O, MACHIN RONALD, BUDDE LOTHAR, MOCCIO CRAIG A, FOLK PATRICK L
Year of Publication 03.02.2010