Highly Sensitive and Quantitative Diagnosis of SARS-CoV-2 Using a Gold/Platinum Particle-Based Lateral Flow Assay and a Desktop Scanning Electron Microscope
Kawasaki, Hideya, Suzuki, Hiromi, Furuhashi, Kazuki, Yamashita, Keita, Ishikawa, Jinko, Nagura, Osanori, Maekawa, Masato, Miwa, Takafumi, Tandou, Takumi, Hariyama, Takahiko
Published in Biomedicines (15.02.2022)
Published in Biomedicines (15.02.2022)
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Journal Article
Effect of surface roughness on small particle adhesion forces evaluated by atomic force microscopy
Miwa, Takafumi, Miya, Go, Kanno, Seiichiro
Published in Japanese Journal of Applied Physics (01.07.2020)
Published in Japanese Journal of Applied Physics (01.07.2020)
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Journal Article
MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE
KIZAWA Shun, MIZUHARA Yuzuru, MIZUTANI Shunsuke, MIWA Takafumi, BIZEN Daisuke, SUZUKI Kohei
Year of Publication 15.06.2023
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Year of Publication 15.06.2023
Patent
CHARGED PARTICLE BEAM DEVICE
NAKAMURA YOHEI, MIWA TAKAFUMI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 22.02.2021
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Year of Publication 22.02.2021
Patent
CHARGED PARTICLE BEAM DEVICE
MIWA TAKAFUMI, NAKAMURA YOHEI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 22.02.2021
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Year of Publication 22.02.2021
Patent
CHARGED PARTICLE BEAM DEVICE
MIWA TAKAFUMI, NAKAMURA YOHEI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 22.02.2021
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Year of Publication 22.02.2021
Patent
CHARGED PARTICLE BEAM APPARATUS
MIWA TAKAFUMI, NAKAMURA YOHEI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 17.02.2021
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Year of Publication 17.02.2021
Patent
CHARGED PARTICLE BEAM APPARATUS
NAKAMURA YOHEI, MIWA TAKAFUMI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 17.02.2021
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Year of Publication 17.02.2021
Patent
CHARGED PARTICLE BEAM APPARATUS
MIWA TAKAFUMI, NAKAMURA YOHEI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TSUNO NATSUKI
Year of Publication 17.02.2021
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Year of Publication 17.02.2021
Patent
PARTICLE MEASUREMENT DEVICE AND METHOD
MIWA Takafumi, HASHIZUME Tomihiro, YASUTAKE Masatoshi, NOMADUCHI Tsunenori
Year of Publication 08.08.2019
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Year of Publication 08.08.2019
Patent
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM INSPECTION SYSTEM
NAKAMURA YOHEI, MIWA TAKAFUMI, KIMIZUKA HEITA, FUKUDA MUNEYUKI, TANAKA JUNICHI, TSUNO NATSUKI
Year of Publication 22.02.2021
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Year of Publication 22.02.2021
Patent