Increased B Cell Selection Stringency In Germinal Centers Can Explain Improved COVID-19 Vaccine Efficacies With Low Dose Prime or Delayed Boost
Garg, Amar K, Mittal, Soumya, Padmanabhan, Pranesh, Desikan, Rajat, Dixit, Narendra M
Published in Frontiers in immunology (30.11.2021)
Published in Frontiers in immunology (30.11.2021)
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Journal Article
Improving Diagnosis Efficiency via Machine Learning
Huang, Qicheng, Fang, Chenlei, Mittal, Soumya, Blanton, R. D.
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
Published in 2018 IEEE International Test Conference (ITC) (01.10.2018)
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Conference Proceeding
Industry Evaluation of Reversible Scan Chain Diagnosis
Mittal, Soumya, Urban, Szczepan, Chung, Kun Young, Janicki, Jakub, Cheng, Wu-Tung, Parley, Martin, Sharma, Manish, Nicholson, Shaun
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
A Deterministic-Statistical Multiple-Defect Diagnosis Methodology
Mittal, Soumya, Shawn Blanton, R. D.
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
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Conference Proceeding
Diagnosis Outcome Preview through Learning
Fang, Chenlei, Huang, Qicheng, Mittal, Soumya, Blanton, R. D. Shawn
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)
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Conference Proceeding
NOIDA: Noise-resistant Intra-cell Diagnosis
Mittal, Soumya, Blanton, R. D. Shawn
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
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Conference Proceeding
Test chip design for optimal cell-aware diagnosability
Mittal, Soumya, Zeye Liu, Niewenhuis, Ben, Blanton, R. D. Shawn
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
PADLOC: Physically-Aware Defect Localization and Characterization
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Conference Proceeding
Achieving 100% cell-aware coverage by design
Zeye Liu, Niewenhuis, Ben, Mittal, Soumya, Blanton, R. D.
Published in 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2016)
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Published in 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2016)
Conference Proceeding
Journal Article
Logic characterization vehicle design reflection via layout rewiring
Fynan, Phillip, Zeye Liu, Niewenhuis, Benjamin, Mittal, Soumya, Strajwas, Marcin, Blanton, R. D. Shawn
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Logic characterization vehicle design for yield learning
Niewenhuis, Ben, Dexter Liu, Zeye, Mittal, Soumya, Blanton, R. D. Shawn
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
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Conference Proceeding
Journal Article
LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology
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Conference Proceeding
Multiple-defect diagnosis for Logic Characterization Vehicles
Niewenhuis, Ben, Mittal, Soumya, Blanton, R. D.
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)
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Conference Proceeding
An Automated Methodology for Logic Characterization Vehicle Design
Liu, Zeye, Niewenhuis, Ben, Mittal, Soumya, Fynan, Phillip, Blanton, R.D. (Shawn)
Published in Electronic device failure analysis (01.02.2019)
Published in Electronic device failure analysis (01.02.2019)
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Magazine Article