Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor
Vereecke, Bart, Cavaco, Celso, De Munck, Koen, Haspeslagh, Luc, Minoglou, Kyriaki, Moore, George, Sabuncuoglu, Deniz, Tack, Klaas, Wu, Bob, Osman, Haris
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
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Journal Article
AlGaN-on-Si-Based 10-μm Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
MALINOWSKI, Pawel E, DUBOZ, Jean-Yves, KROTH, Udo, GOTTWALD, Alexander, LAUBIS, Christian, MERTENS, Robert, VAN HOOF, Chris, DE MOOR, Piet, JOHN, Joachim, MINOGLOU, Kyriaki, SRIVASTAVA, Puneet, SEMOND, Fabrice, FRAYSSINET, Eric, GIORDANENGO, Boris, BENMOUSSA, Ali
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
AlGaN-on-Si-Based 10- mu hbox m Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
Malinowski, Pawel E, Duboz, Jean-Yves, De Moor, Piet, John, Joachim, Minoglou, Kyriaki, Srivastava, Puneet, Semond, Fabrice, Frayssinet, Eric, Giordanengo, Boris, BenMoussa, Ali, Kroth, Udo, Gottwald, Alexander, Laubis, Christian, Mertens, Robert, Van Hoof, Chris
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
AlGaN-on-Si-Based 10-[Formula Omitted] Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
Malinowski, Pawel E, Duboz, Jean-Yves, De Moor, Piet, John, Joachim, Minoglou, Kyriaki, Srivastava, Puneet, Semond, Fabrice, Frayssinet, Eric, Giordanengo, Boris, BenMoussa, Ali, Kroth, Udo, Gottwald, Alexander, Laubis, Christian, Mertens, Robert, Van Hoof, Chris
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
AlGaN-on-Si-Based 10- \mu\hbox Pixel-to-Pixel Pitch Hybrid Imagers for the EUV Range
Malinowski, P. E., Duboz, J., De Moor, P., John, J., Minoglou, K., Srivastava, P., Semond, F., Frayssinet, E., Giordanengo, B., BenMoussa, A., Kroth, U., Gottwald, A., Laubis, C., Mertens, R., Van Hoof, C.
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Backside-Illuminated GaN-on-Si Schottky Photodiodes for UV Radiation Detection
Malinowski, P.E., John, J., Duboz, J.Y., Hellings, G., Lorenz, A., Madrid, J.G.R., Sturdevant, C., Cheng, K., Leys, M., Derluyn, J., Das, J., Germain, M., Minoglou, K., De Moor, P., Frayssinet, E., Semond, F., Hochedez, J.-F., Giordanengo, B., Mertens, R.
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
Backside illuminated AlGaN-on-Si UV detectors integrated by high density flip-chip bonding
Malinowski, Pawel E., Duboz, Jean-Yves, De Moor, Piet, John, Joachim, Minoglou, Kyriaki, Srivastava, Puneet, Abdul, Hameed, Patel, Manojkumar, Osman, Haris, Semond, Fabrice, Frayssinet, Eric, Hochedez, Jean-Francois, Giordanengo, Boris, Van Hoof, Chris, Mertens, Robert
Published in Physica status solidi. C (01.07.2011)
Published in Physica status solidi. C (01.07.2011)
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Journal Article
Enhanced time delay integration imaging using embedded CCD in CMOS technology
De Moor, Piet, Robbelein, Jo, Haspeslagh, Luc, Boulenc, Pierre, Ercan, Alper, Minoglou, Kyriaki, Lauwers, Anne, De Munck, Koen, Rosmeulen, Maarten
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
Reduction of Electrical Crosstalk in Hybrid Backside Illuminated CMOS Imagers using Deep Trench Isolation
Minoglou, Kyriaki, de Munck, Koen, Tezcan, Deniz Sabuncuoglu, Borgers, Tom, Ruythooren, Wouter, Bogaerts, Jan, Veltroni, Iacopo Ficai, Zayer, Igor, Meynart, Roland, Bezy, Jean-Loup, van Hoof, Chris, de Moor, Piet
Published in 2008 International Interconnect Technology Conference (01.06.2008)
Published in 2008 International Interconnect Technology Conference (01.06.2008)
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Conference Proceeding
10 µm pixel-to-pixel pitch hybrid backside illuminated AlGaN-on-Si imagers for solar blind EUV radiation detection
Malinowski, P E, Duboz, J Y, De Moor, P, John, J, Minoglou, K, Srivastava, P, Creten, Y, Torfs, T, Putzeys, J, Semond, F, Frayssinet, E, Giordanengo, B, BenMoussa, A, Hochedez, J F, Mertens, R, Van Hoof, C
Published in 2010 International Electron Devices Meeting (01.12.2010)
Published in 2010 International Electron Devices Meeting (01.12.2010)
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Conference Proceeding